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This experiment investigates the impact of different tin precursors and catalysts on the sol-gel process for fabricating tin-based thin films. Various tin compounds, including Tin isopropoxide, Tin(IV) chloride, and Tin(IV) tert-butoxide, are evaluated at temperatures of 300°C under both wet and dry annealing conditions. The role of acetic acid as a catalyst is also explored. The results reveal variations in mobility, indicating the influence of precursor choice and processing conditions on the material properties of the resulting films.
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Experiment ZTO TFT, sol-gel on chip process 1. Effect of tin precursor (300°C, wet annealing) 1) Tin isopropoxide 2) Tin(IV) chloride 3) Tin(IV) tert-butoxide Mobility 0.014 Mobility 0.007
Result 2. Effect of catalyst (acetic acid) 300°C, dry annealing Acetic acid 1) Tin isopropoxide 2) Tin(IV) chloride 3) Tin(IV) tert-butoxide
2. Effect of catalyst (acetic acid) Tin tert-butoxide + Acetic acid Direct gelation
Experiment 실험 상세
Precursor Tin isopropoxide Dry 1) Tin isopropoxide Acetic acid Wet
Precursor Tin(IV) chloride Dry 2) Tin(IV) chloride Acetic acid Wet
Precursor Tin tert-butoxide Dry 3) Tin(IV) tert-butoxide Acetic acid Wet