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Critical Wavepath Refraction Migration

Critical Wavepath Refraction Migration. Maike Buddensiek, University of Utah, Feb. 2003. Outline. Introduction - Why are we doing this? Basic concept of CRRM method Results of synthetic data Conclusions and further research. Introduction.

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Critical Wavepath Refraction Migration

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  1. Critical Wavepath Refraction Migration Maike Buddensiek, University of Utah, Feb. 2003

  2. Outline • Introduction - Why are we doing this? • Basic concept of CRRM method • Results of synthetic data • Conclusions and further research

  3. Introduction • Refraction data contain hidden information of reflection traveltimes. • After resorting the data, they are kinematical equivalent to critical reflections. • Those critical refractions can be migrated just like reflections. • Less artifacts • Velocity of refracting layer not necessary • Any refractor geometry can be migrated

  4. v1 v2 TAY TAY + TBX - TAB TAY + TBX BasicConcept A X M Y B TAY + TBX - TAB

  5. v1 v2 BasicConcept BasicConcept A X M Y B TAY TAY + TBX - TAB TAY + TBX TAY + TBX - TAB

  6. v1 v2 BasicConcept BasicConcept A X M Y B TAY TAY + TBX - TAB TAY + TBX TAY + TBX - TAB

  7. v1 v2 BasicConcept BasicConcept A X M Y B TAY TAY + TBX - TAB TAY + TBX TAY + TBX - TAB = TXY TAY + TBX - TAB

  8. Critical Distance v1 v2 BasicConcept A X M Y B O TAY + TBX - TAB = TXY TXYdata : kinematics of reflection

  9. v1 v2 O TXO + TOY = TXOYtheory Migration by Raytracing A X M Y B

  10. v1 v2 Incidence Angles for Raytracing   A X M Y B  

  11. v1   v2 O Migration by Raytracing A X M Y B TXOYtheory  TXYdata

  12. Critical Distance v1 v2 Migration by Raytracing A X M Y B O TXOYtheory = TXYdata

  13. v1 v2 A X M Y B CRRM Method • 1. Select A, B, X, Y and then trace rays • 2. Determine TXOYtheory • 3. Determine TXYdata • 4. If TXYdata = TXOYtheory • Smear refraction energy at O. • Otherwise no energy is smeared. O

  14. Dipping Layer Model 1 600 300

  15. Dipping Layer Model 2 600 300

  16. Low Frequency Undulation 600 300

  17. High Frequency Undulation 600 300

  18. Fault Model 600 300

  19. Results • Very accurate mapping of the refractors • No artifacts • The refracting velocity is not known • Problemaict zones just result in unmapped traces

  20. Conclusion • The CRRM method has the potential to migrate refraction data more precisely than traditional methods. • CRRM does not produce artifacts like traditional methods do. • Future Work: Make suggested changes and then apply to field data.

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