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Very Low Voltage Operation of Benchmark Circuit c6288

Very Low Voltage Operation of Benchmark Circuit c6288. Presented By: - Murali Dharan. Objectives. Reduce the power and power delay product of c6288 benchmark circuit To study the effect of voltage reduction on the power dissipation and delay

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Very Low Voltage Operation of Benchmark Circuit c6288

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  1. Very Low Voltage Operation of Benchmark Circuit c6288 Presented By: - Murali Dharan

  2. Objectives • Reduce the power and power delay product of c6288 benchmark circuit • To study the effect of voltage reduction on the power dissipation and delay • To operate the circuit at subthreshold voltage region and study its effect

  3. Need for Voltage Reduction • Ptotal = Pstatic + Pdynamic • Power dissipation with technology scaling • High Pstatic dissipation from 65nm onwards

  4. Circuit Operation • Above threshold voltage, transition due to channel current • Scaling down supply voltage reduces Short circuit power Vdd≤ |Vtp| + Vtn

  5. Why Subthreshold operation? • Below threshold voltage, transition due to subthreshold current Isub= μ0 Cox(W/L)Vt2 exp {(VGS –VTH + ηVDS)/nVt} VDS = drain to source voltage η: a proportionality factor n = sub threshold slope factor (1 + Cd/Cox)

  6. c6288 Circuit Design • The circuit was designed in Verilog • It was synthesized in 0.18 micron technology using LeonardoSpectrum • The synthesized netlist was imported into Design Architect • Timing and power analysis was done using ELDO

  7. Model of 16 Bit Multiplier (c6288)

  8. Simulation Results

  9. Subthreshold Operation

  10. Timing Plot

  11. Power Delay Product Graphs

  12. Conclusion • From the graphs, we can infer that the optimum low voltage operating point is 0.4V which is just above the threshold voltage. • Circuit still functions properly in subthreshold region and gives comparable energy savings to normal operation mode. • More circuits need to be tested to check for subthreshold voltage operations. • Check circuits in high leakage technologies like 65nm and below.

  13. Future Research Work • Testing subthreshold operations of sequential circuits to check if operations like feedback causes circuits to malfunction. • Testing subthreshold operation of benchmark circuits at high leakage technologies as more leakage current can lead to faster switching with less power overhead leading to more energy savings.

  14. References • Spring 2009 slides: ELEC6270 Low Power Design of Electronic Circuits • Dr. Vishwani D. Agrawal • “Modeling and sizing for Minimum Energy Operation in Subthreshold Circuits” IEEE Journal of Solid-State Circuits, Vol.40, No. 9, September 2005 • Benton H. Calhoun, Student member, IEEE, Alice Wang, Member, IEEE, and Anantha Chandrakasan, Fellow, IEEE

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