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Automatic Test System for Mazda BSD Tx Chip

Developed automatic test system for Mazda BSD Tx Chip used in Blind Spot Detection system. Worked with LabVIEW in automotive temperature range for ECU tests, validations, and report generation. Improved testing efficiency and lowered costs.

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Automatic Test System for Mazda BSD Tx Chip

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  1. Faculty of Electronics and Telecommunications Automatic Test System for Mazda BSD Tx Chip Student: Gîdea Marius Iulian Scientific coordinator: Prof.Dr.Ing. Mihaela Lascu Timișoara, 2010

  2. Project requirements: • Develop an automatic test system • Work in automotive temperature range • Use LabVIEW as programming language • ECUs tests and validations • Generate test reports • Easy to modify implemented tests

  3. Automatic test system – block diagram

  4. The test bench:

  5. Personal contributions: • Implement the connecting cable in OrCAD 9.2 • Develop the routing box • Create a map for test points • Design and build the nails adaptor

  6. Personal contributions: • Nails adapter

  7. Personal contributions: • Nails adapter

  8. Personal contributions: • Routing box (front and back panel).

  9. Personal contributions: • Develop the test software in LabVIEW (front panel)

  10. Personal contributions: • Develop the test software in LabVIEW (block diagram)

  11. Personal contributions: • Generate test reports • Run and optimize tests

  12. Personal contributions: • Optimization of the testing times • Create VIs for measuring devices • Develop a CAN communication with the ECU using LabVIEW environment • Assemble the test bench

  13. Mazda BSD Tx Chip • BSD – Blind Spot Detection • The device is a 24 GHz radar • It is mounted in the rear bumper of the car • Warns the driver when there are vehicles in the blind spot of the side-view mirror • Lane changing in the city and on highway becomes safer

  14. Mazda BSD Tx Chip • How it works

  15. Mazda BSD Tx Chip • PWM controlled antenna problem solved immediately using data acquired by the ATS

  16. Conclusions: • Tests and validations of ECUs in short time • Complying automotive standards • High reproducibility for tests • Lower costs for next developed ATS

  17. Thank You

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