an introduction to sims and the minisims tof n.
Download
Skip this Video
Loading SlideShow in 5 Seconds..
An Introduction to SIMS and the MiniSIMS ToF PowerPoint Presentation
Download Presentation
An Introduction to SIMS and the MiniSIMS ToF

Loading in 2 Seconds...

play fullscreen
1 / 48

An Introduction to SIMS and the MiniSIMS ToF - PowerPoint PPT Presentation


  • 263 Views
  • Uploaded on

An Introduction to SIMS and the MiniSIMS ToF. © Millbrook Instruments Limited Blackburn, UK www.millbrook-instruments.com www.minisims.com. Secondary Ion Mass Spectrometry (SIMS) & The Millbrook MiniSIMS. The SIMS Process. simulation courtesy of Dr Postawa Zbigniew

loader
I am the owner, or an agent authorized to act on behalf of the owner, of the copyrighted work described.
capcha
Download Presentation

PowerPoint Slideshow about 'An Introduction to SIMS and the MiniSIMS ToF' - mattox


An Image/Link below is provided (as is) to download presentation

Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author.While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server.


- - - - - - - - - - - - - - - - - - - - - - - - - - E N D - - - - - - - - - - - - - - - - - - - - - - - - - -
Presentation Transcript
an introduction to sims and the minisims tof

An Introduction to SIMS andthe MiniSIMS ToF

© Millbrook Instruments Limited Blackburn, UK

www.millbrook-instruments.com

www.minisims.com

the sims process
The SIMS Process

simulation courtesy of Dr Postawa Zbigniew

at the Jagiellonian University in Poland

design objectives
Design Objectives
  • Increase routine use of Surface Analysis
    • more affordable
    • more accessible
  • Not a replacement for conventional SIMS
    • not state-of-the-art performance
    • restricted analysis conditions
operational strengths
Operational Strengths
  • Low Capital & Running Costs
  • Fast, On-Site Analysis
  • Compact Design, Single Electrical Supply
  • Full Automation & Control for Ease of Use
  • High Reliability
  • Rapid Sample Throughput
  • Simplified Data Interpretation
  • Remote Control via Internet
typical application areas
Surface Coatings

Surface Treatments

Electronic Components

Semiconductors

Electrodes & Sensors

Catalysts

Adhesives

Lubricants

Packaging Materials

Corrosion Studies

Typical Application Areas
alternatives to a minisims
Alternatives to a MiniSIMS ?
  • No Other Benchtop SIMS Instrument
  • Conventional SIMS Systems
    • much more complex and expensive
  • Contract Analysis Laboratories
    • not convenient, contamination during transport
  • Other Surface Analysis Techniques
    • generally less sensitive
advantages of sem eds
Advantages of SEM / EDS
  • High magnification physical image
  • Quantitative elemental information
advantages of sims
Advantages of SIMS
  • Surface specific analysis
  • Organic structure identification
  • Profiling for depth distribution
  • Light element detection
edx sampling depth is typically 1 micron

For many applications surface sensitivity is needed…

EDX sampling depth is typically 1 micron

509 m

Not 100 x

Not 10 x

But 1000 x – SIMS can offer true surface analysis

conclusions
Conclusions
  • SIMS & EDS give complementary information
  • SIMS has advantages for
    • Organic surface contamination
    • 3 dimensional analysis of multi-layer structures
  • SEM / EDS has advantages for
    • High magnification physical imaging
    • Quantitative analysis
typical applications for the minisims tof
Typical Applications for the MiniSIMS ToF
  • Analysis of unknown samples (failure analysis)
  • Analysis of unique samples
  • Improved analysis of organic materials
  • Smaller area static SIMS analysis
  • Retrospective experiments
minisims tof1
MiniSIMS ToF
  • Advantages over Quadrupole Instrument
    • Smaller area static SIMS analysis
    • Extended mass range
    • Higher mass resolution (organic v inorganic)
    • Retrospective experiments
minisims tof2
MiniSIMS ToF
  • Use of Continuous Primary Beam
    • Fast analysis (= low cost per sample)
    • No loss of image resolution in pulsing
    • Simplified depth profiling (single beam)
  • Fast & simple static / imaging / dynamic SIMS in one instrument
effect of decreasing area
Effect of Decreasing Area

Mass Scale

Analysis Area Dimension

Quadrupole Data

effect of decreasing area1
Effect of Decreasing Area

Mass Scale

Analysis Area Dimension

Time of Flight Data

extended mass range1
Extended Mass Range

ToF –ve ion mode: Irganox molecular ion at m/z = 1175 Da

minisims summary
MiniSIMS Summary
  • SIMS is a powerful technique for the 3-D analysis of the surfaces of materials and thin films
  • Information easily available by SIMS may be difficult or impossible by any other technique
  • SIMS is especially valuable for the detection of:-
    • organic species (e.g. silicones, fluorocarbons)
    • light elements (lithium, beryllium, boron …)
    • group IA & IIA metals, group VII halides
minisims summary1
MiniSIMS Summary
  • SIMS is a fast analysis technique, especially for imaging applications
  • MiniSIMS ToF is most effective for a comparative analysis of samples
  • Desktop MiniSIMS means SIMS is now affordable and accessible to all
tof minisims v conventional tofsims
ToF MiniSIMS( v conventional ToFSIMS )
  • Use of Continuous Primary Beam
    • Fast analysis (= low cost per sample)
    • No loss of image resolution in pulsing
    • Simplified depth profiling (single beam)
  • Fast & simple static / imaging / dynamic SIMS in one instrument
  • Upgrade path from Quadrupole to TOF
tof minisims v quadrupole minisims
ToF MiniSIMS( v quadrupole MiniSIMS )
  • Improved Static SIMS from smaller areas
  • Retrospective Experiment
    • 2D Imaging
    • 3D Imaging / Depth Profiling
  • Extended Mass Range
  • Higher Mass Resolution