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Diodes Properties of SWNT Networks Bryan Hicks. Diodes and Transistors. An ever increasing number in an ever decreasing area. Why Carbon Nanotubes ?. Ballistic transport –Low power No chemical passivation necessary allows for a variety of different insulators

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Presentation Transcript
diodes and transistors
Diodes and Transistors

An ever increasing number in an ever decreasing area

why carbon nanotubes
Why Carbon Nanotubes?
  • Ballistic transport –Low power
  • No chemical passivation necessary allows for a variety of different insulators
  • Current densities of 109 A/cm2 vs. 103 A/cm2 for silicon
  • Huge mobility for high speed devices
  • Can be semi-conducting or metallic
carbon nanotube networks
Carbon Nanotube Networks
  • Random networks of tubes
  • Low resistance at CNT junctions
  • No processing necessary
  • 1/3 metallic 2/3 semiconducting
  • Have properties of both metals and semiconductors
fabrication process
Fabrication Process
  • Deposit Al and Au electrodes on to a Si02/Si chip with SWNT networks
  • Wire bond the electrodes to a chip carrier
current rectification properties
Current Rectification Properties

Maximum Current Capacities: Device 1: 8 μA & Device 2: 22 μA

On/off ratios: Device 1: 20 & Device 2: 5

current rectification properties1
Current Rectification Properties

Maximum Current Capacities: 678.9 μA On/off ratios: 27

current rectification properties2
Current Rectification Properties

Maximum Current Capacities: 840 μA On/off ratios: 108

current rectification properties3
Current Rectification Properties

Maximum Current Capacities: 840 μA On/off ratios: ??

gate voltage characterization
Gate Voltage Characterization
  • Current decreases as carriers are removed
  • Current increases as carriers are introduced
  • The hysteresis seen is due to trapping seen in other CNT transistors as well
summary
Summary
  • Carbon Nanotube Networks present an economic way to incorporate CNT properties into macroelectronics
  • Current Rectification seems to be a product of contact resistance and is often lost when various scans are made.
sources
Sources
  • C. Lu, L. An, Q. Fu, J. Liua, H. Zhang and J. Murduck. Appl. Phys. Lett. 88, 133501 (2006)
  • P. Avouris, J. Appenzeller, Richard Martel, And S. J. Wind. Proceedings of the IEEE. 91, 11 (2003)