X ray fluorescence analysis analisa xrf
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X-Ray Fluorescence Analysis (Analisa XRF). Analisis X-ray Fluoresensi. Pendahuluan Prinsip Kerja Skema Cara Kerja Alat Preparasi Sampel Instrumen XRF Contoh spektra. Radiasi Elektromagnetik. 1014Hz - 1015Hz. 1Hz - 1kHz. 1kHz - 1014Hz. 1015Hz - 1021Hz. Extra-Low Frequency (ELF).

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X-Ray Fluorescence Analysis (Analisa XRF)

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X ray fluorescence analysis analisa xrf

X-Ray Fluorescence Analysis

(Analisa XRF)


Analisis x ray fluoresensi

Analisis X-ray Fluoresensi

  • Pendahuluan

  • Prinsip Kerja

  • Skema Cara Kerja Alat

  • Preparasi Sampel

  • Instrumen XRF

  • Contoh spektra


Radiasi elektromagnetik

Radiasi Elektromagnetik

1014Hz - 1015Hz

1Hz - 1kHz

1kHz - 1014Hz

1015Hz- 1021Hz

Extra-Low Frequency (ELF)

Radio

Microwave

Infrared

Visible Light

X-Rays,

Gamma Rays

Low energy

High energy


Pendahuluan

Pendahuluan


Fitur xrf

Fitur XRF


Prinsip kerja

Prinsip Kerja


Peristiwa pada tabung sinar x

Peristiwa pada tabung sinar-X.


Prinsip kerja xrf

Prinsip Kerja XRF

Pada teknik XRF,

  • dienggunakan sinar-X dari tabung pembangkit sinar-X untuk mengeluarkan electron dari kulit bagian dalam untuk menghasilkan sinar-X baru dari sample yang di analisis.


Prinsip kerja xrf1

Prinsip Kerja XRF

  • Untuk setiap atom di dalam sample, intensitas dari sinar-X karakteristik tersebut sebanding dengan jumlah (konsentrasi) atom di dalam sample.

  • Intensitas sinar–X karakteristik dari setiap unsur, dibandingkan dengan suatu standar yang diketahui konsentrasinya, sehingga konsentrasi unsur dalam sample bisa ditentukan.


S kema c ara kerja alat

S kema C ara Kerja Alat


Instrumen xrf

Instrumen XRF

Instrumen XRF terdiridari :

  • Sumbercahaya

  • O ptik

  • Detektor


S yarat s ampel

S yarat S ampel

  • Serbuk

    • Ukuranserbuk < 4 00 mesh

  • Padatan

    • Permukaan yang dilapisiakanmeminimalisirefekpenghamburan

    • Sampelharusdataruntukmenghasilkananalisiskuantitatif yang optimal

  • Cairan

    • Sampelharussegarketikadianalisisdananalisisdilakukansecaracepatjikasampelmudahmenguap

    • Sampeltidakbolehmengandungendapan


S umber c ahaya

S umber C ahaya

  • Tabung Sinar X

    • End W indow

    • Side W indow

  • Radioisotop


T abung sinar x

T abung sinar x

  • End W indow


S ide w indow

S ide W indow

Be W indow

Glass En v elope

H V Lead

Target (Ti, Ag,

Rh, etc.)

Electron beam

Copper Anode

Filament

Silicone Insulation


Radioisotop

Isotope

Fe-5 5

Cm-244

Cd-109

Am-241

Co-57

Energy (keV)

5.9

14.3, 18.3

22, 88

59.5

122

Elements (K-lines)

Al – V

Ti-Br

Fe-Mo

Ru-Er

Ba - U

Elements (L-lines)

Br-I

I- Pb

Yb-Pu

None

none

Radioisotop


Optik

Optik

Detector

Source


Filter

Filter

Source Filter

Detector

X-Ray

Source


C ontoh s pektra

C ontoh S pektra


C ontoh s pektra1

C ontoh S pektra


D etektor

D etektor

  • Si(L i)

  • P N Diode

  • Silicon Drift Detectors

  • Proportional Counters

  • Scintillation Detectors


S i l i d etektor

S i ( L i) D etektor

FET

W Indow

Super-Cooled Cryostat

Dewar

filled with

LN 2

Si(Li)

crystal

Pre-Amplifier

Cooling: LN2 or Peltier

Window: Beryllium or Polymer

Counts Rates: 3,000 – 50,000 cps

Resolution: 120-170 eV at Mn K-alpha


Pin d iode

PIN D iode

  • Cooling: Thermoelectrically cooled (Peltier)

  • Window: Beryllium

  • Count Rates: 3,000 – 20,000 cps

  • Resolution: 170-240 eV at Mn k-alpha


Silicon drift detector

Silicon Drift Detector

Packaging: Similar to PIN DetectorCooling: Peltier

Count Rates; 10,000 – 300,000 cpsResolution: 140-180 eV at Mn K-alpha


Proportional counter

Proportional Counter

Window

Anode Filament

Fill Gases: Neon, Argon, Xenon, Krypton

Pressure: 0.5- 2 ATM

Windows: Be or Polymer

Sealed or Gas Flow Versions

Count Rates EDX: 10,000-40,000 cps WDX: 1,000,000+

Resolution: 500-1000+ eV


X ray fluorescence analysis analisa xrf

Scintillation Detector

PMT (Photo-multiplier tube)

Electronics

Sodium Iodide Disk

Window: Be or Al

Count Rates: 10,000 to 1,000,000+ cps

Resolution: >1000 eV

Connector


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