Static Event Health Monitoring A Capability Improvement Program

1. Static Event Health MonitoringA Capability Improvement Program Tom Odom VCD Technologies San Dimas, California

2. Topics • History of the Technology • Magneto-Optics • Prototype ExMOD Detectors • Detector Fabrication • Proposed Technology Improvements • Risk Analysis & Mitigation • Conclusions

3. History of the technology • Bubble Memories • Developed in the 1970’s as an alternative to magnetic tape data storage • Photo lithographically defined magnetic domains on a single crystal wafer. • Used Large Scale Integration processes developed for the semiconductor industry • Light Modulation Devices • Developed for Military applications in the 1980’s. • Used Single Crystal Magneto-Optic wafers to modulate light in nano-second time frames. • Missile tracking applications • Image Projection • Magneto-Optic Static Event Detectors (MOSED)

4. History of the technology, (continued) Switched pixel • Magneto-Optic Static Event Detectors (MOSED) • Invented and demonstrated in 1990’s • Created to aid in the detection of ESD events. • Magnetic fields created by the ESD transient changes the properties of the Magneto-Optic thin film deposited on a single crystal substrate • Devices can be remotely reset • Effect is observed using a polarizing microscope Un-Switched pixel

5. Magneto-Optics • Magneto-Optic Effects • Kerr Effect for Magneto-Optic Recording • Faraday Effect for Light Modulation and memory devices • Also known as the Magneto-Optic Effect, was the first experimental evidence that light and magnetism are related • Result of ferromagnetic resonance in association with a magnetic field • Resonance causes waves to be decomposed into circularly polarized rays which propagate at different speeds (circular birefringence) • Upon re-combining, owing to the differences in propagation speed, a net phase offset and a resulting rotation of the angle of linear polarization results.

6. Magneto-Optics, (continued) • A magnetic field, caused by ESD transient, Changes the way light is polarized in the M-O Material • Polarization changes are permanent until device is externally reset • Effect is observed using a polarizing microscope

7. Prototype ExMOD Detectors TO-5 packaged Detector • Manufactured from Prototype Magneto-Optic wafers • Uses mature Semiconductor wafer processing techniques and materials 0.030 3.00 Over 6000 die can be produced from a 3 inch diameter wafer 0.020

8. Detector Fabrication • M-O Thin film is grown over non magnetic substrate wafer • Wafer is patterned and etched in the sequences shown below • M-O devices are characterized and tested to determine electro-optic performance

9. Prototype DetectorsAdvantages of the old Technology • Resettable: The device can be reset as many times as desired so long as the current remains below protection level. • Static Memory: The device remains permanently switched after an ESD event until reset. Alternatively, the device can be observed continuously to record the time and threshold of the event. • Small Size: The die can be as small as 500mm x 750mm. • External Readout: The device can be read without physical contact, using a polarizing microscope/optical system. • External Reset: The sensing device can be reset with an external non-contact device. • Solid State: Operates at extreme temperatures and environments. • Fast Switching: Provides discharge detection of fast ESD pulses generated by HBM, CDM, and MM events. • Polarity Sensitivity: If required, the device can distinguish the polarity of the ESD event. • Sensitivity Levels: High or low threshold devices will be available. • Pulse Resolution: Current devices can detect ESD events down to 300mA. • Custom Configuration: Available for customer specific applications with associated engineering development.

10. Prototype DetectorsDisadvantages of the old Technology • Difficult to view • Expensive microscopes are required to view the event • Dual Polarizer analyzers required • Difficult for customer to Assemble • High Cost of Fabrication at low volume • Customer acceptance of new technology

11. Proposed Technology Improvements for CTMA / NCMS Cost share • Detector Device Improvements • Replace multi-domain detector (14 individual sensors) with a single, active, domain • Add a redundant domain for Readout verification Increase domain size to increase readout signal strength and simplification Active Domain Redundant domain

12. Proposed Technology Improvements for CTMA / NCMS Cost share Alternative Two Cell Structure to discriminate polarity

13. Proposed Technology Improvements for CTMA / NCMS Cost share Readout Reset Device Improvements Replace the polarizing microscope with an autonomous reader. The new reader will consist of the following components & subsystems • Polarized light source • Magnifier • Charge coupled device (CCD) camera or other sensing device • Optical elements that cross polarize incoming and reflected light • Processor • Result indicator To read the MOSED, a Reader is placed above and in proximity to the MOSED to determine its state of polarization To reset the device , a permanent or electro-magnet device is integrated with the readout device Example of Readout Device concept

14. Operational Scenario Proposed Technology Improvements for CTMA / NCMS Cost share

15. Risk Analysis & Mitigation • Multiple Deliveries • MOSED Device in discrete package • Static Sensitive Test devices integrated with the new SED to characterize performance • Multiple threshold devices for wide range of ESD sensitive devices • Diverse Applications • Surge Suppression device will be co-developed • Use state-of-the-art surge suppression technology • Couple with MOSED to identify existence of surge • Government Review and Concurrence throughout development cycle • Multiple workshops to obtain government input • Reduces risk of redesign to meet user needs

16. Conclusions • Detection of ESD events can benefit the life cycle of electronic devices • Manufacturers can improve on processes that historically have damaged, destroyed or degrade devices. • End users can improve their handling of ESD sensitive devices, resulting in improved reliability in the field. • Depot repair facilities can improve their ability to minimize field returns thereby providing added value to their repair/replacement functions. • The Existing MOSED technology can be improved to overcome deficiencies in a risk-controlled CTMA cost share development program • Provides Government and industry users with cost effective tools necessary to detect, analyze and control ESD events • Dual Use technology improvements will result in significant cost savings for government and industry.