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Optimizing Electronic Circuits: Assessing Noise Levels and Testing Failure Situations

This project focuses on evaluating noise levels, conducting tests, and inspecting failure situations in electronic circuits. We aim to identify and address issues related to radiations, dump levels, and circuit failure. By assessing and improving circuit functionalities, we ensure dependability and reliability.

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Optimizing Electronic Circuits: Assessing Noise Levels and Testing Failure Situations

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  1. ~ ACHV DC board Noise ~ SIL Approach Electronic Our Situation Radiations Tests Dump Levels Inspection and Failure Circuits Irad Year DCIC Cont. C Isig RHV RIC Cont. Daily Daily RCFC IC ~ RICP CIP CCFC Daily RCS RICS switch DC+AC board ~ HV Noise -50Hz RCG Noise ~ High Voltage Ionization Chamber Cable Current to Frequency Converter BLM Dependability. G.Guaglio

  2. SIL Approach Electronic Our Situation Radiations Tests Dump Levels IC testing BLM Dependability. G.Guaglio

  3. SIL Approach Electronic Our Situation Radiations Tests Dump Levels CFC testing BLM Dependability. G.Guaglio

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