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Exploring Sample Preparation Techniques in X-Ray Diffraction: Focus on Aluminum Peaks

This workshop delves into sample preparation strategies for aluminum peak analysis during X-ray diffraction (XRD). It highlights the significance of specimen holder cavity surface interactions and artifacts in data interpretation. Key discussions include using intense NaCl as a standard for the beam footprint determination on specimen holders. Participants can gain valuable insights into refining their XRD techniques and overcoming common challenges in sample analysis.

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Exploring Sample Preparation Techniques in X-Ray Diffraction: Focus on Aluminum Peaks

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  1. ICDD Workshop 1 and 3Sample PreparationGroup D

  2. Aluminum peaks ??

  3. Specimen holder cavity surface diffracting.

  4. From group A Example of artifacts in data Wow!! Intense NaCl (200) Blue 2c Red 1b Ni Abs edge Kb (111)

  5. Don’t forget that you can use Halite (NaCl) as a template to determine your beam “footprint” on your specimen holders.

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