'Vlsi circuits' presentation slideshows

Digital Integrated Circuits A Design Perspective

Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikoli ?. Timing Issues. January 2003. Synchronous Timing. Timing Definitions. Latch Parameters. D. Q. Clk. T. Clk. PW m. t su. D. t hold. t d-q. t c-q. Q.

1.1k views • 80 slides

Digital Integrated Circuits A Design Perspective

Digital Integrated Circuits A Design Perspective. Jan M. Rabaey Anantha Chandrakasan Borivoje Nikoli ?. Timing Issues. January 2003. Synchronous Timing. Timing Definitions. Latch Parameters. D. Q. Clk. T. Clk. PW m. t su. D. t hold. t d-q. t c-q. Q.

947 views • 80 slides

Intel

Intel. Labs. Microprocessor and DSP Technologies for the Nanoscale Era. Seminar 2 Ram Kumar Krishnamurthy Microprocessor Research Labs Intel Corporation, Hillsboro, OR ram.krishnamurthy@intel.com. July 11, 2005. Outline. General Technology and Circuit Challenges Beyond 65nm:

658 views • 37 slides

1. Introduction 2. Trends in RAMs 3. Challenges to Low-Voltage(LV) RAMs

FTFC2003, Paris, May 15 2003. Trends in Low-Voltage RAM Circuits. Kiyoo Itoh, Hitachi Ltd. Outline. 1. Introduction 2. Trends in RAMs 3. Challenges to Low-Voltage(LV) RAMs 4. Subthreshold-Current Reduction RAM Cells / Peripheral Circuits 5. Perspectives 6. Conclusion. 16 G. 10,000.

430 views • 24 slides

1. Introduction 2. Trends in RAMs 3. Challenges to Low-Voltage(LV) RAMs

FTFC2003, Paris, May 15 2003. Trends in Low-Voltage RAM Circuits. Kiyoo Itoh, Hitachi Ltd. Outline. 1. Introduction 2. Trends in RAMs 3. Challenges to Low-Voltage(LV) RAMs 4. Subthreshold-Current Reduction RAM Cells / Peripheral Circuits 5. Perspectives 6. Conclusion. 16 G. 10,000.

241 views • 24 slides

VLSI Testing Lecture 4b: Fault Simulation

VLSI Testing Lecture 4b: Fault Simulation. Problem and motivation Fault simulation algorithms Serial Parallel Concurrent Random Fault Sampling Summary. Problem and Motivation. Fault simulation Problem: Given A circuit A sequence of test vectors A fault model Determine

520 views • 18 slides

SSCS Meetings Comm. Adcom Review

SSCS Meetings Comm. Adcom Review. August 12, 2013. Adcom Agenda. Financially Sponsored ISSCC Chandrakasan Summary of Financially Sponsored Meetings Summary of Technical Co-sponsored Meetings Summary of Actions for Approval. SSCS AdCom – August, 12 th 2013 Tom Andre.

292 views • 18 slides

Yield Estimation based on Layout & Process Data

499 views • 17 slides

VLSI Testing

VLSI Testing. ??? Kuen-Jong Lee 06-2757575 X 62371 kjlee@mail.ncku.edu.tw September 13, 2011. IC Design & Production Flow. 1. Design House 2. Foundry 3. Foundry or Testing House 4. Packaging House 5. Testing House. IC Design & Design-for-Test. Wafer Manufacturing. Wafer Testing.

313 views • 6 slides

VLSI Training in chennai

Ampere VLSI Academy, a division of Mobiveil Technologies, offers a high-profile VLSI Verification course in the field of Semiconductor design. Ampere VLSI Academy, a division of Mobiveil Technologies, has structured the course to have right mix of lectures combined with lab projects to transform a graduate engineer to a skilled work force in Verification domain which is on demand today across the globe. http://www.amperevlsi.com/

78 views • 6 slides