'Tam width' presentation slideshows

Li Jiang 1 , Qiang Xu 1 , Krishnendu Chakrabarty 2 , and T. M. Mak 3

Layout-Driven Test-Architecture Design and Optimization for 3D SoCs under Pre-Bond Test-Pin-Count Constraint. Li Jiang 1 , Qiang Xu 1 , Krishnendu Chakrabarty 2 , and T. M. Mak 3 1 Deptartment of CS&E, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong

428 views • 26 slides

System-on-Chip (SoC) Testing

System-on-Chip (SoC) Testing. SoC Wrapper/TAM Design. Scan Chain Architectures*. * J. Aerts and E. J. Marinissen, ITC 1998, pp. 448-457. Paper Summary. Given: # pins SoC available for external scan test # scan patterns of each core # scan FFs in each core

725 views • 26 slides

Modular SOC Testing With Reduced Wrapper Count

268 views • 17 slides