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Instrument Electronics

Instrument Electronics. Henrik von der Lippe Lawrence Berkeley National Laboratory November 11 th , 2003. Outline. Overview & strategy Baseline for SNAP Instrument electronics system R&D goals Progress last year CCD & IR focal plane modules Mass memory & Compression

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Instrument Electronics

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  1. Instrument Electronics Henrik von der Lippe Lawrence Berkeley National Laboratory November 11th, 2003

  2. Outline • Overview & strategy • Baseline for SNAP Instrument electronics system • R&D goals • Progress last year • CCD & IR focal plane modules • Mass memory & Compression • Observatory Control Unit • Schedule • Manpower • R&D management • R&D deliverables • Summary

  3. Instrument electronics Spectrograph OCU & Mem Imager Thermal Ctrl Star Guider

  4. Instrument Electronics Layout Focal plane Battery OCU Power system Mass memory

  5. Strategy for Instrument Electronics • Employ existing, tested solutions with space flight heritage wherever possible • Avoid single-point failures and maintain redundancy where possible within power, weight, cost budgets • Keep number of components and interconnections to a minimum for reliability • Reduce number and length of cables carrying low-level analog signals to avoid noise pickup, crosstalk • Use a common architecture for readout of different sensors to extent possible, to reduce number of different electronics systems • Have a fallback option for areas of technical or schedule risk

  6. Baseline SNAP Electrical System • System is has no single point failures • Fully redundant and cross strapped on spacecraft side • Redundant Observatory Control Units and Large Memories on instrument side • Instrument Detectors and Mechanisms modularized for failure tolerance • Uses Industry Standard (e.g. 1553) interface between instrument and spacecraft • Wide band downlink controlled directly by instrument • Memory Capability incorporated into the Instrument • No need for Solid State Recorder in spacecraft • Spacecraft consists of 3 independent modules connected by a 1553 bus • Power system • ACS System • C&DH System

  7. R&D Goals • Risk mitigation through early R&D • System requirements & interface control documents • Conceptual design of electronics/DAQ system/Instrument control • Realistic cost & schedule estimate for CDR • There are only a few key areas where hands-on R&D is required for risk mitigation, mostly in front-end readout and control • The remainder of the electronics R&D program consists primarily of requirements & interface documentation, conceptual design studies, and cost and schedule estimates for the CDR.

  8. Electronics Working Concept • Front-end electronics (control and readout) mounted on back of cold plate • Reduces cable plant, simplifies grounding & shielding issues, mass • Minimize cross-talk, pickup for small analog signals • Reduces power consumption due to increase in e- mobility • Avoid problems associated with driver on CCD - power, noise • Compatible with HgCdTe readout being developed by Rockwell for NASA - must be <10 cm from sensor & operate cold • Thermal constraints - must keep cold plate cold • Implications for total power and mass of cold plate • Back-end electronics located in shielded room temperature boxes mounted on space craft • Lower radiation exposure • Simpler temperature requirement • No thermal impact on focal plane

  9. Progress last year • Successful Front-end test IC (CRIC)Design specs: • Photometry: CCD + electronic noise  4.0e- rms • Spectrograph: CCD + electronic noise  2.0e- rms • Large dynamic range: 96dB from noise floor to 130k e- well depth (16-bit) • Readout frequency: 100 kHz & 50kHz • Radiation tolerance: 10 kRad ionization (well shielded) • Power:  200mJ/image/channel => 10mW/channel (6.5mW for the analog front-end, 3.5mW for the ADC) • Operation at 140K and 300K • Combined CRIC-CCD test in progress (one year ahead of schedule) • Radiation tolerance testing in progress • Overall block diagram for the instrument has been developed

  10. CRIC ASIC – Dual-ramp correlated Double Sampler with a multislope integrator for each corner of the CCD. 96 dB dynamic range ADC – 12-bit, 100 kHz equivalent conversion rate per CCD Backup FE under development by Paris-VI Sequencer – Clock pattern generator supporting modes of operation: erase, expose, readout, idle. Clock drivers – Programmable amplitude and rise/fall times. Voltages ~20V Bias and power generation – Provide switched, programmable large voltages for CCD and local power. (60-80V) Temperature monitoring – Local and remote. DAQ and instrument control interface – Path to data buffer memory, master timing, and configuration and control. CCD module Star Guider

  11. Bias and power generation – Provide bias voltages for detector & multiplexer Temperature monitoring DAQ and instrument control interface – Path to data buffer memory, master timing, and configuration and control. The Rockwell SIDECAR ASIC provides: Programmable gain pre-amplification 16 bit, 100kHz Analog to digital conversion Sequencer – Clock pattern generator supporting modes of operation: erase, expose, readout, idle. Control signals for reading out the mux Multi-read averaging for noise reduction IR module

  12. Observatory Control Unit (OCU) • Includes all interfaces to the detectors and instrument for both science and housekeeping data • A given unit connects to either the prime or the redundant interface on focal plane modules • Has redundant cross strapped interface to Spacecraft Electronics • Comprised of seven major subassemblies • DPU • Interfaces to SC C&DH via a single 1553 port on the DPU • Provides command and engineering data interface • Memory Control / Formatter • Manages Instrument data storage memory • Provides 300 Mhz science data output which directly drives the Ka band transmitter • Data Compression • Lossless compression of all science data • I/O and Control • Collect focal plane science data • Operates motors and mechanisms • Collects instrument housekeeping • Performs power distribution to focal plane electronics • Centroid calculation of guider star for the ACS • Calibration control • Controls all calibration lamps • Thermal control • Sets up control for ~1k heater elements • Power Control

  13. Mass memory • Two memory technology types are being studied • Flash • DRAM • Tests: • Error rate • Access speed • Durability (# write cycles) • Radiation tolerance • Total dose • SEU • SEL

  14. Data Compression • Algorithms • CCSDS 120.0 Baseline (Rice) • Sqrt(N) + CCSDS 120.0 • The algorithms are being test with data from SLOAN and GOODS • Evaluation of FPGA for algorithm implementation • Survey of alternative FPGA’s • Performance • Radiation Tests on Candidate FPGA Technologies • Evaluation of ASIC’s • Survey of existing IC’s • Applicability of existing IC to SNAP

  15. R&D Schedule Milestones

  16. R&D Schedule Milestones

  17. R&D Schedule Milestones

  18. R&D Schedule Milestones

  19. R&D Schedule Milestones

  20. Manpower

  21. Electronics R&D Management • Team lead is H. von der Lippe (LBNL) • Weekly meetings with scientists & engineers to review progress, discuss requirements, etc. • Bi-weekly video meetings between LBNL and Paris to coordinate electronic R&D activities. These meeting will be converted to Instrument Electronics meetings • Regular participation in SNAP science, CCD detector, SNAP system engineering & management meetings • Instrument manager meetings to coordinate between electronics R&D and CCD, HgCdTe, spectrograph R&D activities • Planning for internal and external reviews • Preliminary design requirements review • Pre-submission IC design, simulation & verification review • Preliminary conceptual design review

  22. R&D Deliverables Two classes • Paper trade studies and conceptual design studies • Active SNAP advancement of a technology “Paper” deliverables • Detailed requirements & interface control documents • Overall system architecture & design partitioning • Power, grounding & shielding plan • Study of CCD controller options: FPGA, commercial part, VHDL (Custom IC) • Study of memory components • Study of compression algorithms • Study of thermal control system • Plan for space-qualification of all parts Hardware deliverables • CCD front-end test chip; irradiation & low-temp testing • Test of Rockwell HgCdTe readout IC (SIDECAR) • Prototype demonstration for front-end readout: - CDS/ADC + CCD sensor - HgCdTe readout + sensor

  23. Summary • SNAP instrument electronics presents challenges for high channel count, low noise, low power, low temperature, large dynamic range, and radiation tolerance • R&D phase will be used to develop requirements, interfaces and system architecture as basis for a detailed cost and schedule for the Conceptual Design Report • Development of ASIC-based front-end readout requires a limited and focused plan for hands-on R&D towards proof-of-principle prototypes • R&D management is in place and already actively guiding development

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