SPC for Real-World Processes. William A. Levinson, P.E. Intersil Corporation Mountaintop, PA. What’s wrong with this picture?. Particle counts, semiconductor manufacturing process. The normal distribution does not fit the histogram well.
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William A. Levinson, P.E.
Particle counts, semiconductor manufacturing process
(Cells at right were merged for the chi square test)
Particle control chart
f(x) is the probability density function
that uses the indicated shape, scale,
and threshold parameters.
14.23, 12 degrees of freedom, can’t reject gamma fit