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IR detector for demonstrator and Readout

IR detector for demonstrator and Readout. A. Castera, S. Gardien,C. Girerd,H. Mathez, G. Smadja IPNL/Université Cl. Bernard/IN2P3 FRANCE. IR Detector Readout. IR detector performance in the SNAP context Tests H1RG Electronic Readout Connections:tests Schedule.

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IR detector for demonstrator and Readout

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  1. IR detector for demonstrator and Readout A. Castera, S. Gardien,C. Girerd,H. Mathez, G. Smadja IPNL/Université Cl. Bernard/IN2P3 FRANCE

  2. IR Detector Readout • IR detector performance in the SNAP context • Tests • H1RG Electronic Readout • Connections:tests • Schedule Votre Nom

  3. SNAP spectrograph context • Low Photon fluxes at z>1: 1.5g/m2/s z=1.5 • Divided into 50-100 spectral bins • H1RG detector bought from Rockwell by IN2P3 • Efficiency of detector • Leakage current (Poisson fluctuations) • Readout Noise : 22 exposures (1000s) at z = 1.5 longer expo? • Sensitivity to ultimate performance reached by detector/readout • Optimize non destructive readout scheme Votre Nom

  4. IR Detector specifications Votre Nom

  5. IR Detector Actual (2.5µm) Votre Nom

  6. IR Readout specifications • Monitor Noise and leakage current: System noise ~ 1e • Dynamic range >100 000 (Check linearity) • Check frequency behaviour >1 MHz* • Different gains needed for Noise monitoring /Full range • Software assistance available • * To reduce the readout noise for low signals by multiple readouts (?) Votre Nom

  7. Non destructive ramp readout Measurements are correlated Decrease with Nb Readouts limited by 1/f noise Votre Nom

  8. Goals of tests • Check H1RG and readout performance • Detector properties at several wavelengths: • 0.85,1.30,1.45,1.65 µm • (in view of future photometric and PSF measurements) • Produce Maps of Noise,QE,Gain,Leakage current • Investigate 1/f noise in long exposures • Investigate multiple readouts and optimize • Transfer working acquisition system to LAM for • Spectrograph tests end June 2006 Votre Nom

  9. H1RG readout system (Lyon) • Motherboard specific to H1RG (ADC,Ampli,Dac) • Mezzanine with µprocessor+FPGA (from OPERA exp) • Clock rate up to 5 MHz • Amplifier 1nV/sqrt(Hz)>100Hz (Dn~ 1-10MHz) • (AD797, Gain~5 to 10, ENC~ 0.3-1e) • 16 bit ADC 38µV/step (input gain GADC = 1-10) • (SPT8100,Fairchild, H1RG = 3µV/e ) • Noise sensitivity ~ 1.6 electrons/digit (with GADC = 8 ) • Dynamic range for this gain: 100000 e Votre Nom

  10. Mezzanine µprocessor card Votre Nom

  11. Scheme of Motherboard Dacs, ADC, etc…, clocking up to 5 MHZ + subsampling Layout is completed Votre Nom

  12. Readout Cards Schedule Motherboard layout completed End November 2005 Mezzanine card available: End November 2005 Mezzanine Software (FPGA, µprocessor) Mid January 2006 Motherboard delivered Mid December 2005 Tests of readout of Motherboard done Mid -February 2006 Test bare mux February 2006 Votre Nom

  13. Slow control functionalities + connections • Connect H1RG Hirose Kapton • Single flex board, no connector to outside • 92 pins H1RG+ slow controls • 1 19 pin connector (analog signals) • 5 x27 pin throughput (digital + controls) • Temperature monitoring : thermistances • Resistors for temperature control • (level and stability) • Light diodes at selected wavelength • Photodiodes: monitoring of illumination Votre Nom

  14. Connecting Card LED Digital througputs H1RG detector Supporting pilars Optical references Vessel Throughput (Analog out) photodiodes Thermistances+resistors+ Connectors NOT shown Kapton from H1RG Votre Nom

  15. Connecting Card and environment Fiberglass throughputs (intermediate cooling) Fiberglass thermal damping Cold plate Cold plate +connection card+detector to be moved to LAM Votre Nom

  16. Connecting Card schedule Complete layout of connecting card : End November 2005 Connection from card to outside via FLEX Strip assignment of flex completed: November 11th Order placed: November 18th Readout system ready : Mid February 2006 Bare Multiplexer tested : End February 2006 Test cryostat needed : February 2006 Votre Nom

  17. Conclusion • Test programme foreseen at Lyon(February to July 2006) • Optimize readout settings • (noise,dynamic range,ref pixel subtraction) • Map detector at different temperatures and • Wavelengths (leakagecurrent,gain,efficiency,noise) • Investigate behaviour during long exposures • Test ultrashort exposures/partial reset • intrapixel homogeneity (if time….) Votre Nom

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