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IR detector for demonstrator and Readout

Detailed specifications, goals, and schedule for testing IR detectors and readout system for SNAP spectrograph demonstrator. Includes testing at different wavelengths, noise monitoring, and optimizing readout settings.

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IR detector for demonstrator and Readout

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  1. IR detector for demonstrator and Readout A. Castera, S. Gardien,C. Girerd,H. Mathez, G. Smadja IPNL/Université Cl. Bernard/IN2P3 FRANCE

  2. IR Detector Readout • IR detector performance in the SNAP context • Tests • H1RG Electronic Readout • Connections:tests • Schedule Votre Nom

  3. SNAP spectrograph context • Low Photon fluxes at z>1: 1.5g/m2/s z=1.5 • Divided into 50-100 spectral bins • H1RG detector bought from Rockwell by IN2P3 • Efficiency of detector • Leakage current (Poisson fluctuations) • Readout Noise : 22 exposures (1000s) at z = 1.5 longer expo? • Sensitivity to ultimate performance reached by detector/readout • Optimize non destructive readout scheme Votre Nom

  4. IR Detector specifications Votre Nom

  5. IR Detector Actual (2.5µm) Votre Nom

  6. IR Readout specifications • Monitor Noise and leakage current: System noise ~ 1e • Dynamic range >100 000 (Check linearity) • Check frequency behaviour >1 MHz* • Different gains needed for Noise monitoring /Full range • Software assistance available • * To reduce the readout noise for low signals by multiple readouts (?) Votre Nom

  7. Non destructive ramp readout Measurements are correlated Decrease with Nb Readouts limited by 1/f noise Votre Nom

  8. Goals of tests • Check H1RG and readout performance • Detector properties at several wavelengths: • 0.85,1.30,1.45,1.65 µm • (in view of future photometric and PSF measurements) • Produce Maps of Noise,QE,Gain,Leakage current • Investigate 1/f noise in long exposures • Investigate multiple readouts and optimize • Transfer working acquisition system to LAM for • Spectrograph tests end June 2006 Votre Nom

  9. H1RG readout system (Lyon) • Motherboard specific to H1RG (ADC,Ampli,Dac) • Mezzanine with µprocessor+FPGA (from OPERA exp) • Clock rate up to 5 MHz • Amplifier 1nV/sqrt(Hz)>100Hz (Dn~ 1-10MHz) • (AD797, Gain~5 to 10, ENC~ 0.3-1e) • 16 bit ADC 38µV/step (input gain GADC = 1-10) • (SPT8100,Fairchild, H1RG = 3µV/e ) • Noise sensitivity ~ 1.6 electrons/digit (with GADC = 8 ) • Dynamic range for this gain: 100000 e Votre Nom

  10. Mezzanine µprocessor card Votre Nom

  11. Scheme of Motherboard Dacs, ADC, etc…, clocking up to 5 MHZ + subsampling Layout is completed Votre Nom

  12. Readout Cards Schedule Motherboard layout completed End November 2005 Mezzanine card available: End November 2005 Mezzanine Software (FPGA, µprocessor) Mid January 2006 Motherboard delivered Mid December 2005 Tests of readout of Motherboard done Mid -February 2006 Test bare mux February 2006 Votre Nom

  13. Slow control functionalities + connections • Connect H1RG Hirose Kapton • Single flex board, no connector to outside • 92 pins H1RG+ slow controls • 1 19 pin connector (analog signals) • 5 x27 pin throughput (digital + controls) • Temperature monitoring : thermistances • Resistors for temperature control • (level and stability) • Light diodes at selected wavelength • Photodiodes: monitoring of illumination Votre Nom

  14. Connecting Card LED Digital througputs H1RG detector Supporting pilars Optical references Vessel Throughput (Analog out) photodiodes Thermistances+resistors+ Connectors NOT shown Kapton from H1RG Votre Nom

  15. Connecting Card and environment Fiberglass throughputs (intermediate cooling) Fiberglass thermal damping Cold plate Cold plate +connection card+detector to be moved to LAM Votre Nom

  16. Connecting Card schedule Complete layout of connecting card : End November 2005 Connection from card to outside via FLEX Strip assignment of flex completed: November 11th Order placed: November 18th Readout system ready : Mid February 2006 Bare Multiplexer tested : End February 2006 Test cryostat needed : February 2006 Votre Nom

  17. Conclusion • Test programme foreseen at Lyon(February to July 2006) • Optimize readout settings • (noise,dynamic range,ref pixel subtraction) • Map detector at different temperatures and • Wavelengths (leakagecurrent,gain,efficiency,noise) • Investigate behaviour during long exposures • Test ultrashort exposures/partial reset • intrapixel homogeneity (if time….) Votre Nom

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