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Explore the requirements and definitions of compression dumps in OCI investigations. Learn how to transition to bypass patterns effectively for diagnostic purposes and enhance data collection during fail occurrences. Discover the Shadow and Real-Time Bypass Architectures for efficient data capture in JTAG and diagnostic modes.
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OCI Investigations The Embedded Compression Dump
Requirement-Definition • What is Compression Dump? • During a diagnostic mode – the storage of “bypass patterns” for use “at some later time” is not palatable for many customers • The reliance on a vendor’s particular solution is not palatable • The use of “simulation” in a Fab or FA environment to determine the logic related to a reported fail is not always possible • There are many tools/vendor-solutions available if the Patter/Chain/Bit of scan chains is available Crouch
TDI DeCompressor Compacto r SDO[0:n] SDO[0:n] Expect TDO The JTAG Shadow Architecture In Diagnostic mode, when a Fail occurs the JTAG Shadow Register Captures the State of the last set of flops that feed the Compactor – this allows Pattern/Chain/Bit to be rebuilt since Pattern & Bit are known; if the compactor has pipelining then the pattern must be re-applied and captured at the cycle when the fail enters the compactor Crouch
Logic Last ScanFlop thatfeedsCompactor SDIfromprevScanCell To Compactor TDIfromprevJTAGCell Scan Clk Shift-DR TDOto nextJTAGCell Capture-DR Fail_Enable JTAG TCK or Scan Clk IJTAG Capture Cell Crouch
DeCompressor Compacto r SDO[0:n] SDO[0:n] Expect The Real-Time Bypass Architecture In Diagnostic mode, when a Fail occurs the Compression Architecture converts to the bypass architecture – the ATE must go into data capture mode. To allow full-data collection, it is best to run the architecture up to before the Sample and to dump the “apply” vector; then run it again and dump the “response” vector; the “golden” state is from dumping a good/golden part Crouch