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Outline . . Introduction Transmission line characterization for on-wafer device measurements Monolithic millimeter-wave ICs Mixed-signal medium-scale ICs. Apply scaling approaches of Si-devices with material advantages of III-V systems to realise ultra-fast transistorsPrevious research: Transferred-substrate HBT technologyCurrent research: Highly scaled mesa-HBT technologyWhy is the wiring environment important to us?Accurate device measurements require controlled ZOMonolithic 33055
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