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Energy optimization for probabilistic boolean logic circuits and its applications

Energy optimization for probabilistic boolean logic circuits and its applications. Presenter: Yung-Chun Hu Advisor: Prof. Chun-Yao Wang 2014/06/16. Outline. Introduction Problem Formulation Power Optimization Applications Experimental Results Conclusion. Probabilistic CMOS.

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Energy optimization for probabilistic boolean logic circuits and its applications

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  1. Energy optimization for probabilistic boolean logic circuits and its applications Presenter: Yung-Chun Hu Advisor: Prof. Chun-Yao Wang 2014/06/16

  2. Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion

  3. Probabilistic CMOS Noise effect Lower VDD

  4. Energy of a Probabilistic Inverter Energy per switching: Energy ratio Probability

  5. Probabilistic Boolean logic • Notations • OR: • AND: • NOT: • Let probabilistic parameter A 0.9 F B

  6. Voltage v.s. probability • PTM 45nm SPICE model INV NAND2

  7. Correctness Definition • Correctness under an input pattern • Golden value = 1: • Golden value = 0: • Correctness of POj:

  8. Problem formulation • Problem formulation: • Given: • A Boolean circuit • A library of probabilistic gates • Correctnessconstraint • Determine: The locations of probabilistic gates such that power consumption minimized

  9. Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion

  10. Random vs. Level-order replacement

  11. testability • A Statistic-based approach to testability analysis,C.-C. Chiou et al, 2008 • Notations: • V(wire/gate): simulation results on a wire/gate • Cr(wire/gate): criticality vector on a wire/gate • The change of critical bits will cause at least one PO change.

  12. Testability

  13. Testability

  14. Testability 0.25 1 0.5 1 1 0.5

  15. Testability 0.25 1 1 0.5 4 1 2 5 1 0.5 6 3

  16. PO-aware Testability

  17. PO-aware Testability

  18. PO-aware Testability 0.083 0.33 0.25 0.33 0.33 0.167

  19. PO-aware Testability 0.083 1 0.33 4 0.25 3 0.33 5 0.33 0.167 6 2

  20. Po-aware testability • # of probabilistic gates=2, p=0.9 • Since we build the criticality vectors for each PO, the weighted PO-aware testability can be obtained through the following equation:

  21. PO-aware Testability-based replacement approach

  22. Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion

  23. Applications • Three applications • 32-bit adder • Average image filter • Edge detector • Weighted correctness and testability evaluation: for ith bit

  24. adder • AVG_Weighed_Correctness=99

  25. adder • AVG_Weighed_Correctness=95

  26. adder • AVG_Weighed_Correctness=91

  27. adder • Error & Power

  28. Average image filter • An average image filter can be used to soften an image. • For every pixel, the filter averages its surround 8 pixels and itself.

  29. Average image filter • Resultant images and PSNR values

  30. Average image filter • AVG_Weighed_Correctnessv.s. PSNR value

  31. Average image filter • AVG_Weighed_Correctnessv.s. power

  32. Average image filter • AVG_Weighed_Correctnessv.s. normalized power Around 20% power reduction

  33. Edge detector • Sobel operation: , where A is the source image and is convolution operation • Approximation:

  34. Edge detector • The difference between Sobel operation and approximation • PSNR: 47.67

  35. Edge detector • Resultant images and PSNR values

  36. Edge detector • AVG_Weighed_Correctnessv.s. PSNR value

  37. Edge detector • AVG_Weighed_Correctnessv.s. power

  38. Edge detector • AVG_Weighed_Correctnessv.s. normalized power Around 10% power reduction

  39. Outline • Introduction • Problem Formulation • Power Optimization • Applications • Experimental Results • Conclusion

  40. Experimental results • The relationship between switching energy consumption and correctness under (a) AVG_Correctness for alu4. (b) AVG_Correctness for dalu.

  41. Experimental results • The ratios of probabilistic gates and switching energy consumption in PBCs with voltage domains of 1.0V, 0.9V, or 0.8V under the AVG_Correctness constraint of 90%

  42. Experimental results • The ratio of circuit delay under AVG_Correctness constraint of 90%for 0.8V voltage domain

  43. Experimental results • Probabilistic gate number comparisom between different strategies under AVG_Correctness constraint of 90%for 0.8V voltage domain

  44. Experimental results • Power-delay-product of PO-aware testability-based strategy under AVG_Correctness constraint of 90%for 0.8V voltage domain

  45. Conclusion • This is the first work that discusses the power minimization of PBC designs • We propose a power minimization flow that efficiently reduces the power consumption of PBC designs

  46. Thank you for your attention Q & A

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