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Microscopy Resolution

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Microscopy Resolution

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    1. OU NanoLab/NSF NUE/Bumm & Johnson Microscopy & Resolution Magnification: Image size/Object size Resolution: The fineness of detail that can be distinguished in an image.

    2. OU NanoLab/NSF NUE/Bumm & Johnson Definitions Acceptance angle ? Numerical Aperture NA = n sin? Rayleigh resolution criterion for a circular aperture ?x = 0.61 ?/NA

    3. OU NanoLab/NSF NUE/Bumm & Johnson OPTICAL MICROSCOPES Image construction for a simple biconvex lens

    4. OU NanoLab/NSF NUE/Bumm & Johnson Rayleigh criterion for resolution

    5. OU NanoLab/NSF NUE/Bumm & Johnson Comparison

    6. OU NanoLab/NSF NUE/Bumm & Johnson Dark-Field Optical Microscopy

    7. OU NanoLab/NSF NUE/Bumm & Johnson Dark-Field Optical Microscopy

    8. OU NanoLab/NSF NUE/Bumm & Johnson THE ELECTRON MICROSCOPE The wavelength of the electron can be tuned by changing the accelerating voltage. de Broglie : ? = h/mv ?: wavelength associated with the particle h: Planks constant 6.6310-34 Js; mv: momentum of the particle me= 9.110-31 kg; e = 1.610-19 coulomb P.E eV = mv2 ? ? = h/?(2meV) = 12.3/?V (for V in KV, ? in ) V of 60 kV, ? = 0.05 ? ?x ~ 2.5 Microscopes using electrons as illuminating radiation TEM & SEM

    9. OU NanoLab/NSF NUE/Bumm & Johnson

    10. OU NanoLab/NSF NUE/Bumm & Johnson Components of the TEM Electron Gun: Filament, Anode/Cathode Condenser lens system and its apertures Specimen chamber Objective lens and apertures Projective lens system and apertures Correctional facilities (Chromatic, Spherical, Astigmatism) Desk consol with CRTs and camera Transformers: 20-100 kV; Vacuum pumps: 10-6 10-10 Torr

    11. OU NanoLab/NSF NUE/Bumm & Johnson Schematic of E Gun & EM lens

    12. OU NanoLab/NSF NUE/Bumm & Johnson TEM IMAGES

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