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Performance Evaluation of ASDBLR2000 Chips: Threshold Uniformity and Noise Measurements

This document presents test measurements of 80 ASDBLR2000 chips performed at UPenn and NIKHEF, focusing on threshold uniformity, linearity, noise characteristics, cross-talk effects, and double pulse separation. Detailed results and analysis can be found at the provided link.

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Performance Evaluation of ASDBLR2000 Chips: Threshold Uniformity and Noise Measurements

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  1. Threshold uniformity ASDBLR2000 ASDQ Nov 2001 lot of 80 tested chips Upenn test measurements NIKHEF test measurements of COT testboard

  2. Threshold linearity ASDBLR99 ASDQ ASDBLR2000

  3. Noise ASDBLR99 ASDQ Noise freq at C=0 pF http://www.nikhef.nl/~edvdb/asdqmeasurements.pdf

  4. Cross talk ASDBLR99 ASDQ  Xtalk measured by increasing input charge until victim channel gives output(50%) type 1= 0ns delay between source channel and victim channel type2= 14ns delay  Xtalk measured by increasing input charge until victim channel gives output(50% “of the time”) Measured at 1.7 fC threshold

  5. Double Pulse Separation ASDBLR99 ASDQ Time distance to detect a MIP after a Arbitrary size of Previous (first) pulse Max Dead time (ns) 70 2fC or 4 fC after 25fC 60 50 40 18fC after 25fC 18fC after 100fC 30 20 10 http://www.nikhef.nl/~edvdb/asdqmeasurements.pdf 25 fC 50 fC 100 fC Ref LHCb 2000-054

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