1 / 5

Threshold uniformity

This document outlines the detailed testing and measurement results of the ASDBLR2000 chips, as conducted by UPenn and NIKHEF in November 2001. The analysis includes evaluations of threshold uniformity, noise characteristics at varying capacitance loads, and the investigation of cross talk between channels measured by input charge variations. Additionally, parameters such as double pulse separation and maximum dead time under specific test conditions are provided. For full details, refer to the linked measurements report.

biana
Download Presentation

Threshold uniformity

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Threshold uniformity ASDBLR2000 ASDQ Nov 2001 lot of 80 tested chips Upenn test measurements NIKHEF test measurements of COT testboard

  2. Threshold linearity ASDBLR99 ASDQ ASDBLR2000

  3. Noise ASDBLR99 ASDQ Noise freq at C=0 pF http://www.nikhef.nl/~edvdb/asdqmeasurements.pdf

  4. Cross talk ASDBLR99 ASDQ  Xtalk measured by increasing input charge until victim channel gives output(50%) type 1= 0ns delay between source channel and victim channel type2= 14ns delay  Xtalk measured by increasing input charge until victim channel gives output(50% “of the time”) Measured at 1.7 fC threshold

  5. Double Pulse Separation ASDBLR99 ASDQ Time distance to detect a MIP after a Arbitrary size of Previous (first) pulse Max Dead time (ns) 70 2fC or 4 fC after 25fC 60 50 40 18fC after 25fC 18fC after 100fC 30 20 10 http://www.nikhef.nl/~edvdb/asdqmeasurements.pdf 25 fC 50 fC 100 fC Ref LHCb 2000-054

More Related