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This report outlines the advancements made in the P1149.8.1 standard aimed at enhancing boundary-scan testing through capacitive sensing technology. Key features include detection of open device pins and support for incomplete nets, enabling effective testing of devices with Boundary-Scan on one side and none on the other. The introduction of the "Selective Toggle" instruction allows for the generation of edges, pulses, and frequencies on selected I/O pins, both for single-ended and differential configurations. Finalization efforts are nearing completion, with a ballot draft expected soon.
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Progress Report:P1149.8.1 Kenneth P. Parker Agilent Technologies Loveland, CO Board Test Workshop, 2010
What is P1149.8.1? • A standard to support Boundary-Scan based stimulus for testing technologies based on capacitive sensing (a’la “TestJet”) • Aimed principally at detecting open device pins • Quite useful for “incomplete” nets, such as those with Boundary-Scan on one side, but nothing on the other (e.g, vacant connectors). • Offers a new instruction “Selective_Toggle” • Can create edges, pulses and frequencies on selected I/O pins
Single-ended Pins • Outputs are given the ability to selectively toggle • Inputs are equipped with an output drive capability, that can selectively toggle • Both are recommended to monitor their pin state while doing EXTEST (self-monitors)
Differential Pins • Outputs are given the ability to selectively toggle in two modes: • Balanced (normal differential) • Unbalanced (non-differential) • Both modes needed for opens testing • Inputs are equipped with an output drive capability, that can selectively toggle • Both are recommended to monitor their pin state while doing EXTEST (self-monitors)
Progress to Date • We are closing in on a ballot draft • Work remaining: • Finalize Single-ended and Differential pins • Create BSDL extension • Update Annex on P1149.8.1 and 1149.6 co-existence in a single device • To Ballot by New Years ? (It could happen!) • Want to vote? (Jeff.Burgess@Intel.com)