'Test vectors' presentation slideshows

Part B Presentation Winter 2011 ASIC Tester Performed by : AboRaya Dia Damouny Samer

High Speed Digital Systems Lab in collaboration with VLSI Lab Electrical Engineering Department, Technion. Part B Presentation Winter 2011 ASIC Tester Performed by : AboRaya Dia Damouny Samer. Supervised by : Ina Rivkin . Overview :.

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FSM State Assignment for Area, Power and Testability using Modern Optimization Techniques

FSM State Assignment for Area, Power and Testability using Modern Optimization Techniques. Mohammed Mansoor Ali Computer Engineering Department. Outline. Introduction Finite State Machines (FSMs) FSM State Assignment (Encoding) FSM Encoding for Area FSM Encoding for Power

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EE466: VLSI Design Lecture 17: Design for Testability

EE466: VLSI Design Lecture 17: Design for Testability. Outline. Testing Logic Verification Silicon Debug Manufacturing Test Fault Models Observability and Controllability Design for Test Scan BIST Boundary Scan. Testing. Testing is one of the most expensive parts of chips

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Tailoring Tests for Functional Binning of Integrated Circuits

Tailoring Tests for Functional Binning of Integrated Circuits. Suraj Sindia ( szs0063@auburn.edu ) Vishwani D. Agrawal ( agrawvd@auburn.edu ) Dept. of ECE, Auburn University, Auburn, AL. 21 st IEEE Asian Test Symposium, Niigata, Japan. Outline. Motivation Problem Statement

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An Algorithm for Diagnostic Fault Simulation

An Algorithm for Diagnostic Fault Simulation. Yu Zhang Vishwani D. Agrawal Auburn University, Auburn, Alabama 36849 USA. Introduction. Need for diagnosis: Debugging over large chip area Complex manufacturing process Step 1: narrow down fault candidates for given fault model.

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VLSI Testing Lecture 4b: Fault Simulation

VLSI Testing Lecture 4b: Fault Simulation. Problem and motivation Fault simulation algorithms Serial Parallel Concurrent Random Fault Sampling Summary. Problem and Motivation. Fault simulation Problem: Given A circuit A sequence of test vectors A fault model Determine

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Logisim

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Final FED 1 Testing Set Up Testing idea and current status Preliminary results Future development

M. Noy 29-01-2003. Final FED 1 Testing Set Up Testing idea and current status Preliminary results Future development Summary. Some known (and relevant) signal. Data processing. FF1 emulator (SW). FF1 (real). SW comparison of processed data. Analysis of functionality

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Sec 01: Logisim

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Minimize Test Power for Benchmark Circuit c6288 by Optimal Ordering of Test Vectors

Minimize Test Power for Benchmark Circuit c6288 by Optimal Ordering of Test Vectors. By: Paul Wray. What is the c6288. 16x16 Multiplier 32 inputs 32 outputs 2406 gates. Approach. Obtain Test Vectors using Matlab .

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ECE 448: Spring 12 Lab Midterm Exam Review

ECE 448: Spring 12 Lab Midterm Exam Review. Agenda for today. Part 1: Detailed discussion of a selected midterm from Spring 2011. Part 2: Review & discussion of common mistakes made by students in Lab 1-3 Part 3: Lab demos and grading. Selected midterm from Spring 2011.

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Logic Simulator for Combinational Circuit

Logic Simulator for Combinational Circuit. Jie Qin Dept. of Electrical and Computer Engineering Auburn University, AL 36849, USA. Problem Statement. Develop a logic simulator with support for the standard bench format and the hierarchical bench format.

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A Diagnostic Test Generation System

A Diagnostic Test Generation System. Yu Zhang Vishwani D. Agrawal Auburn University, Auburn, Alabama 36849. Outline . Introduction: Diagnostic ATPG p roblem Define diagnostic coverage A d iagnostic ATPG system Exclusive test Diagnostic fault simulation Experimental results

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Equality Detector

Equality Detector. Lecture L6.3 Section 6.1. Equality Detector. XNOR. X Y Z 0 0 1 0 1 0 1 0 0 1 1 1. X. Z. Y. Z = !(X $ Y). 4-Bit Equality Comparator. A = [A3..A0]; B = [B3..B0]; C = [C3..C0];. Sets. A = [A3..A0]; B = [B3..B0]; C = [C3..C0];.

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VHDL Project I: Introduction to Testbench Design

VHDL Project I: Introduction to Testbench Design. Slides Available at: www.pages.drexel.edu/~mjm46. Matthew Murach. Goals for this Lab/Announcements. Finish up the design of the Shift Registers, Controller, and Packaging by the end of today. Start on the testbench design layout.

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Local Decoding of Walsh Codes to Reduce CDMA Despreading Computation

Local Decoding of Walsh Codes to Reduce CDMA Despreading Computation. Matthew Doherty. CDMA Cell Sites Are Power-Hungry. Code Division Multiple Access Moves multiple access problem to DSP Computation uses more power than other standards (TDMA, GSM, etc.).

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ECE 545 Project 2 Specification Part I

ECE 545 Project 2 Specification Part I. Task 1. Adjust your synthesizable code for Project 1 in such a way that it complies with the following requirements: a. your code implements the function of the encryption/decryption unit of RC5 without key scheduling unit, and

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Lab 4

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Literary Survey

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