M. Noy 29-01-2003. Final FED 1 Testing Set Up Testing idea and current status Preliminary results Future development Summary. Some known (and relevant) signal. Data processing. FF1 emulator (SW). FF1 (real). SW comparison of processed data. Analysis of functionality
FF1 emulator (SW)
SW comparison of processed data
Analysis of functionality
VME interface for PC control
12 bit DAC and fully differential op-amp with common mode offset
digital sequencer 40MHz
Sequence control logic
VME interface logic
I have developed software using XDAQ and the HAL
FedTesterObject: encapsulates functionality interface
FedTesterApplication: instantiates a (the) FedTesterObject(s); inherits from xdaqApplication and FedTesterSOAPCommandListener
Plus additional required SO class
Results from the system: preliminary
The optical output is fed into the first Optobahn opto-rx version, through 50 co-ax, into a 50 terminated scope.
wave, period 50ns.
(channel 0, bias setting 0x17, gain setting 1)
10% to 90% rise time:
90% to 10% fall time:
Settling time believed to be better than 17ns,
analogue noise believed to be less than 10mV, but not characterised yet.
Linearity looks sufficient, but no detailed measurements have been made yet.
Muxed pair of APV25 frames with pedestals only.
Muxed pair of APV25 frames with a 1 MIP (approx.) hit
HIP event: from the X5 beam test data.
Master trigger in
Clock and trigger distribution (propagation matched lines)
4 identical VME boards 6U in size
Master triggers in
Front End Modules
BE to FE bus
with clock and L1A
Slave trigger and clock
1 back end module controlling synchronisation and 4 front end modules
I2C from BE
SRAM - optional add on,
512kB x 36 @80MHz
To temp unit
Clock and Trigger from BE
I2C from BE
Single Front End Module
6 DAC 6 op-amp 2 analogue opto-tx-hybrid (current layout)
The optical test board works, and will be used to test the FF1.
Have a 9U crate, VME64x backplane, and 3.3v psu at IC.
Software for the set up is functional, we can produce test vectors and sequence
tests. Some work is required to make it more user-friendly.
The next optical test card is being developed to provide multiple individually
configurable channels, stepping towards more automation ( production testing)