'Sram cell' presentation slideshows

ELEC 7770 Advanced VLSI Design Spring 2014 Soft Errors and Fault-Tolerant Design

ELEC 7770 Advanced VLSI Design Spring 2014 Soft Errors and Fault-Tolerant Design. Vishwani D. Agrawal James J. Danaher Professor ECE Department, Auburn University Auburn, AL 36849 vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal/COURSE/E7770_Spr14. Soft Errors.

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Optimization of Power Reduction in FPGA Interconnect by Charge Recycling

Optimization of Power Reduction in FPGA Interconnect by Charge Recycling. Deepa Soman , HyunSuk Nam, Rekha Srinivasaraghavan , Shashank Sivakumar. Agenda. Day 2 Power Reduction Techniques (Conti) Charge Recycling Our Project Discussions. Day 1 Intro Power Consumption Techniques

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SEU protection methods in ASICs (+ 1 word on TID)

SEU protection methods in ASICs (+ 1 word on TID). Sandro Bonacini sandro.bonacini@cern.ch. A word on Total Ionizing Dose (TID). Modern CMOS deep-submicron technologies like 130 nm require a limited effort in order to make TID-hard circuits Core logic only thin oxide transistors

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Optimizing Power @ Design Time Memory

Optimizing Power @ Design Time Memory. Role of Memory in ICs. Memory is very important Focus in this chapter is embedded memory Percentage of area going to memory is increasing. [Ref: V. De, Intel 2006]. Processor Area Becoming Memory Dominated.

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EE534 VLSI Design System summer 2004 Lecture 14:Chapter 10 Semiconductors memories

EE534 VLSI Design System summer 2004 Lecture 14:Chapter 10 Semiconductors memories. Chapter 10: SEMICONDUCTOR MEMORIES. Memory classification (more history than technical) Memory architecture and basic operations The memory core (data storage units)

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CSE241A VLSI Digital Circuits Winter 2003 Lecture 02: Datapath and Memory

CSE241A VLSI Digital Circuits Winter 2003 Lecture 02: Datapath and Memory. Introduction: Basic Building Blocks. Datapath Execution units Adder, multiplier, divider, shifter, etc. Register file and pipeline registers Multiplexers, decoders Control

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Digital Design: Principles and Practices

Digital Design: Principles and Practices. Chapter 9 Memory, CPLDs, and FPGAs. 9.1 Read-Only Memory. Read-Only Memory (ROM). A read-only memory ( ROM ) is a combinational circuit with n inputs and b outputs.

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FinCACTI : Architectural Analysis and Modeling of Caches with Deeply-scaled FinFET Devices

FinCACTI : Architectural Analysis and Modeling of Caches with Deeply-scaled FinFET Devices. Department of Electrical Engineering University of Southern California. Alireza Shafaei, Yanzhi Wang, Xue Lin , and Massoud Pedram. http://atrak.usc.edu/. Outline. Introduction FinFET Devices

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Asynchronous SRAM in 45nM CMOS NCSU Free PDK Paper ID: CSMEPUN-1011-033

Asynchronous SRAM in 45nM CMOS NCSU Free PDK Paper ID: CSMEPUN-1011-033 International Conference on Computer Science and Mechanical Engineering 10 th November 2013, Pune Paper presented by: Nirav Desai, Assistant Professor, Dept. of ECE, ITM Universe

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SRAM DESIGN PROJECT PHASE 2

SRAM DESIGN PROJECT PHASE 2. Nirav Desai 4280229 VLSI DESIGN 2: Prof. Kia Bazargan Dept. of ECE College of Science and Engineering University of Minnesota, Twin Cities. University of Minnesota. SRAM CELL READ AND WRITE MARGIN FROM BUTTERFLY CURVE

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CMOS Detector Technology

CMOS Detector Technology. Markus Loose Rockwell Scientific. Vyshnavi Suntharalingam MIT Lincoln Laboratory. Alan Hoffman Raytheon Vision Systems. Scientific Detector Workshop, Sicily 2005. Photodiode. Photodiode. Amplifier. +. Pixel.

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Performance Evaluation of Packet Classi?cation on FPGA-based TCAM Emulation Architectures

Performance Evaluation of Packet Classi?cation on FPGA-based TCAM Emulation Architectures. GLOBECOM (Global Communications Conference), 2012 . Presenter: NTHU 101062607 ???. Outline. Introduction Related Work TCAM Emulation RAM-based TCAM Architecture Performance Evaluation Conclusion.

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bansuk.co.kr

Tel: 02) 874-8844 Fax: 02) 873-3211 ????? : ??? (sky@bansuk.co.kr). www.bansuk.co.kr. Bansuk industrial. ? ? ? ?. ? ? : ??? ??? ??? ? ? : 1989. 6. 1 ???? : ? ? ?. Business Partners(Suppliers). 1. Bansuk industrial. Components.

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PERFECT Empower Project: Prototype Software Releases

PERFECT Empower Project: Prototype Software Releases. PI: Massoud Pedram Co-PIs: Murali Annavaram and Kaushik Roy (Purdue) July 17, 2014. DARPA Perfect Releases: Overview. Device Releases (nominal devices)

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3D Memory Cells

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Chapter 10 Memory Circuits

Chapter 10 Memory Circuits. SRAM DRAM Dual Ported SRAM. Building Blocks for Memory Sys. Decoders-Encoders Regenerative CKTs Sense Amp x-coupled inverters SRAM cell D-ff Pad Drivers. Block Diagram for Memory Sys. Row/Col Decoder. Row/Col Decoder. Row Decoder. Row Decoder.

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Large-Scale SRAM Variability Characterization Chip in 45nm CMOS

Large-Scale SRAM Variability Characterization Chip in 45nm CMOS. High end microprocessors continue to require larger on-die cache memory > 6 ? of statistics needed to capture the variability of large cache memories Problem: Getting statistics across large designs is $$ and difficult

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Large-Scale SRAM Variability Characterization Chip in 45nm CMOS

Large-Scale SRAM Variability Characterization Chip in 45nm CMOS. High end microprocessors continue to require larger on-die cache memory > 6 ? of statistics needed to capture the variability of large cache memories Problem: Getting statistics across large designs is $$ and difficult

185 views • 4 slides