'Interaction volume' presentation slideshows

Short description Beam parameters influence on image e - gun components filaments lenses

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Short description Beam parameters influence on image e - gun components filaments lenses

Scanning Electron Microscopy (SEM). Short description Beam parameters influence on image e - gun components filaments lenses Beam-sample interaction electron scattering Image formation. Goldstein, Scanning Electron Microscopy and X-ray Microanalysis.

733 views • 73 slides

Short description Beam parameters influence on image e - gun components filaments lenses

763 views • 73 slides

ELECTRON -SPECIMEN INTERACTIONS SPECIMEN PREPARATION ELECTRON MICROSCOPES

ELECTRON -SPECIMEN INTERACTIONS SPECIMEN PREPARATION ELECTRON MICROSCOPES . EML 5930 (27-750) Advanced Characterization and Microstructural Analysis A. D. Rollett, P.N Kalu Spring 2006. Electron Target Interactions: Electron Optical Imaging and chemical analysis are based upon Detecting ,

831 views • 49 slides

ELECTRON -SPECIMEN INTERACTIONS SPECIMEN PREPARATION ELECTRON MICROSCOPES

ELECTRON -SPECIMEN INTERACTIONS SPECIMEN PREPARATION ELECTRON MICROSCOPES . EML 5930 (27-750) Advanced Characterization and Microstructural Analysis A. D. Rollett, P.N Kalu Spring 2008. Electron Target Interactions: Electron Optical Imaging and chemical analysis are based upon Detecting ,

730 views • 49 slides

Electron beam lithography (EBL)

Electron beam lithography (EBL). Overview and resolution limit. Electron source (thermionic and field emission). Electron optics (electrostatic and magnetic lens). Aberrations (spherical, chromatic, diffraction, astigmation). EBL systems (raster/vector scan, round/shaped beam)

954 views • 40 slides

John H. Fournelle

The Problem of Secondary Fluorescence in EPMA in the Application of the Ti-in-Zircon Geothermometer And the Utility of PENEPMA Monte Carlo Simulations. John H. Fournelle. Eugene Cameron Electron Microprobe Lab

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Electron microscopy

Electron microscopy. 200801195 ???. Electron microscopy. INDEX 1. Fundamentals 2. Scanning electron microscopy 3. Transmission Electron microscopy 4. Comparison. 1. Fundamentals. *Wave-Particle Duality (the matter wave) KE= =qV = (de Broglie relation) ? = (h=6.626 ).

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Lab meetings Week of 6 October

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The probe

Some material used from:. The probe. EPMA - electron probe microanalysis. Probe signals. EPMA - electron probe microanalysis. 'New' signal - cathodoluminescence visible and near-visible radiation. Application: identify impurities in semiconductors. EPMA - electron probe microanalysis.

403 views • 21 slides

The probe

Some material used from:. The probe. EPMA - electron probe microanalysis. Probe signals. EPMA - electron probe microanalysis. 'New' signal - cathodoluminescence visible and near-visible radiation. Application: identify impurities in semiconductors. EPMA - electron probe microanalysis.

220 views • 21 slides

SCANNING ELECTRON MICROSCOPE

MATERIAL SCIENCE ASSIGNMENT. SCANNING ELECTRON MICROSCOPE. BY SANTANU PRAMANIK(09369) HITESH KUMAR GUPTA(09320) CHANDAN SINGH(09260). History. TEM constructed in 1931 Von Ardenne first STEM in 1938 by rastering the electron beam in a TEM Zworykin et al. 1942, first SEM for bulk samples

839 views • 20 slides