'Depth profiling' presentation slideshows

Secondary Ion Mass Spectrometry

1.04k views • 52 slides

Status and Science Results D. S Burnett and Genesis Science Team GPMC, Nov 2008

Status and Science Results D. S Burnett and Genesis Science Team GPMC, Nov 2008. Slides Background/Review Material 3-10 Ne Assessment of Concentrator Performance 11-12 N isotopes 13-23 Elemental Abundances 24-37 Contamination Issues 38-46 Status/Summary 47-54. Contents.

649 views • 51 slides

568 views • 40 slides

PHI 710 Scanning Auger Nanoprobe

PHI 710 Scanning Auger Nanoprobe. Complete Auger Compositional Analysis for Nanotechnology, Semiconductors, Advanced Metallurgy and Advanced Materials. PHI Auger 710 Superior Analytical Capabilities. Nanoscale image resolution Image registration for high sensitivity

823 views • 37 slides

HIDEN SIMS

HIDEN SIMS. Hiden SIMS. Secondary Ion Mass Spectrometry Analysis Technique Instrumentation SIMS Workstation Bolt on components Applications Summary. Sputtered Neutrals. - ve Molecules. + ve Ions. - +ve Molecules. -Ve Ions. COLLISION CASCADE ALTERED LAYER. Electrons.

532 views • 32 slides

Cutting and Sputtering: Getting to the Buried Interface

Cutting and Sputtering: Getting to the Buried Interface. John F Watts The Surface Analysis Laboratory Department of Mechanical Engineering Sciences 2 July 2014. The Problem!. Inorganic Layers. J E Castle et al, Corr Sci , 16 , 145-158, (1975). High Temperature Oxidation.

393 views • 27 slides

Cutting and Sputtering: Getting to the Buried Interface

Cutting and Sputtering: Getting to the Buried Interface. John F Watts The Surface Analysis Laboratory Department of Mechanical Engineering Sciences 2 July 2014. The Problem!. Inorganic Layers. J E Castle et al, Corr Sci , 16 , 145-158, (1975). High Temperature Oxidation.

413 views • 27 slides

Cutting and Sputtering: Getting to the Buried Interface

Cutting and Sputtering: Getting to the Buried Interface. John F Watts The Surface Analysis Laboratory Department of Mechanical Engineering Sciences 2 July 2014. The Problem!. Inorganic Layers. J E Castle et al, Corr Sci , 16 , 145-158, (1975). High Temperature Oxidation.

272 views • 27 slides

AP 5301 / 8301 Instrumental Methods of Analysis

AP 5301 / 8301 Instrumental Methods of Analysis. Course Coordinator: Prof. Paul K. Chu Electronic mail: paul.chu@cityu.edu.hk Tel: 34427724 Fax: 34420542. Reference Books.

454 views • 21 slides

AP 5301 / 8301 Instrumental Methods of Analysis

AP 5301 / 8301 Instrumental Methods of Analysis. Course Coordinator: Prof. Paul K. Chu Electronic mail: paul.chu@cityu.edu.hk Tel: 34427724 Fax: 27889549. Reference Books.

340 views • 21 slides

Extended Quadric Error Functions for Surface Simplification

Extended Quadric Error Functions for Surface Simplification . Deepak Bandyopadhyay COMP 258 F2000 Project. Quadric-based Simplification (Garland and Heckbert, SIGGRAPH97 ). Works on triangle meshes Iterative edge-collapse based (also face)

318 views • 20 slides

MicroLap Technology

Depth Profiling of Composition. MicroLap Technology. Some samples are too opaque to allow the IR beam to penetrate to the depth of interest. Spectral overlaps may also interfere with depth profiling. In these cases a micro-lapping approach allows spectra to be measured layer-by-layer.

183 views • 10 slides

MBE Upgrades

MBE Upgrades. What upgrades? Change cell type to have a more narrow openning QCM to determine Ti flux and quicker calib . Why (in general) need to do these upgrades? Better control of Sr , Ba & Ti fluxes Too much variation from time shutter opens because of built up pressure

204 views • 8 slides

Depth Profiling using XPS

Depth Profiling using XPS. By alternating the collection of XPS signals for selected peaks of the spectra with sputtering of the top surface layers using ion beam etching, we can construct the depth distributions of the selected elements.

274 views • 1 slides