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Metrology session. 17 attendees 5 talks Active discussion and many new ideas presented Probably could have been able to organize more turnout, speakers with additional planning time (many contributors could not attend). Metrology. Two divergent problems identified:
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Metrology session • 17 attendees • 5 talks • Active discussion and many new ideas presented • Probably could have been able to organize more turnout, speakers with additional planning time (many contributors could not attend)
Metrology Two divergent problems identified: • Metrology as required for several diverse scientific applications (ICF, astronomy, materials science) • Metrology for synchrotron instrumentation (mirrors, crystals, etc.) which is likely needed for NSLS-II itself
Guidance from our friends at APS • You can do a lot with a metrology beamline, mostly to benefit synchrotron instrumentation • NSLS-II will need a dedicated metrology program in order to meets its stated objectives (this necessarily includes both at-wavelength and lab-based metrology)
New opportunities presented • Proposed “Virtual National Lab on metrology” may provide limited assistance with metrology needs of NSLS-II • Developments in soft x-ray optics & detectors (mirrors, gratings, polarimeters) desired • Optical temperature sensor desired for cryo-cooled silicon monochromator • LCLS reflective optics requires metrology
Transition plans for existing users • NNSA hopes to fund 1 or two new beamlines at NSLS-II (BM, 3PW), moving upgraded endstations & order sorter – projected utilization at least 70% • NRL would like to move 1 beamline (3PW), expects funds for upgrades to mirrors and gratings – projected utilization roughly 50% • Stonybrook topography group would like a (DW) beamline with vertically widened beam and white light capability – projected utilization roughly 40%