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STAVE Serial Powering

Mitch Newcomer. STAVE Serial Powering. Serial Power Status, Comment on Approach. Part 1. Custom Serial Power Control Block Update. Gamma Radiation Sensitivity of D u al Output SP Control Opamp.

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STAVE Serial Powering

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  1. Mitch Newcomer STAVE Serial Powering Serial Power Status, Comment on Approach

  2. Part 1 • Custom Serial Power Control Block Update ATLAS Upgrade Week Nov, 2010

  3. Gamma Radiation Sensitivity of Dual Output SP Control Opamp This Redundant Output Opampwas submitted as an independent part of the SPI chip Serial Power Submission. Objective: Test Current limited redundant output approach. Implement a Rad Tolerant design. TSMC ¼ um process Gate Around NMOS. Background ATLAS Upgrade Week Nov, 2010

  4. Results from Basic Operational tests performed at BNL Tests Performed by Phil Kuczewski @ BNL Nov 2010 Thanks to Phil and David Lynn ATLAS Upgrade Week Nov, 2010

  5. Test Configuration Expect ½ Gain with two Parallel FB paths. Stictly done for testing Purposes. Not this way for SP. ATLAS Upgrade Week Nov, 2010

  6. Vary Input for Several Feedback Conditions: out1, out2 or both(3) Not Irradiated V(Input) ATLAS Upgrade Week Nov, 2010

  7. Vary Input for Several Feedback Conditions: out1, out2 or both(3) 60MRad BNL Gammas ATLAS Upgrade Week Nov, 2010

  8. Input offset Voltage No Irradiation 60MRad Gammas 18mV Shift? Average Input Offset = 1.5mV ATLAS Upgrade Week Nov, 2010

  9. Response to a Transient (Post 60MRad) ATLAS Upgrade Week Nov, 2010

  10. Conclusions • Tests on multiple parts indicate the opamp works well both in AC and DC performance. • Out1 and Out2 matching is excellent. • Although part #14 was not measured prior to its 60MRad exposure to gammas it matches well part #11 which was not exposed to radiation. • Input offset on part #11 and #14 are well within the +/- 25mV maximum offset that would be acceptable for Serial Powering (SP) applications. • This preliminary set of tests gives confidence that the dual output opamp on the SPI chip can be used for SP voltage regulation during radiation tests on an SCT hybrid to test with the distributed shunt regulation approach. ATLAS Upgrade Week Nov, 2010

  11. Part II Considerations for the selection of the number of elements in a Serial Power chain. ATLAS Upgrade Week Nov, 2010

  12. Why consider the number of elements in th Serial Power Chain Now ? • Serial powering is an unusual technique for which there is very limited practical experience. • It promises the advantage of a significant reduction in high Z material in the SCT. • As a baseline element in the stave prototype project with multiple mission objectives there is a high value in a first time, plug n play, success.  From the systems point of view the theme should be: Choose the least aggressive design for which a significant benefit can be demonstrated. Do it, declare victory, move on. • Smaller number of Serial power stages  more robust operation with low startup (tuning) overhead. • Towards the objective of a final product, this first implementation can be considered as a qualifier in a staged development. • Run SP in a very robust, low risk configuration, gain experience, stress it, check for abnormal behaviors, then consider a longer chain. ATLAS Upgrade Week Nov, 2010

  13. Some Comparisons of 12 and 24 Hybrid Serial Power chains. Not most current measurement. ATLAS Upgrade Week Nov, 2010

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