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Orientation relationships of copper crystals on C-plane sapphire

Orientation relationships of copper crystals on C-plane sapphire D. Chatain 2 , S. Curiotto 2 , P. Wynblatt 1 and G.S. Rohrer 1 1 MRSEC, Carnegie Mellon University, Pittsburgh, PA CNRS, Aix-Marseille Univ., CINAM-UPR3118, campus de Luminy , F-13288 Marseille, France

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Orientation relationships of copper crystals on C-plane sapphire

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  1. Orientation relationships of copper crystals on C-plane sapphire D. Chatain2, S. Curiotto2, P. Wynblatt1 and G.S. Rohrer1 1MRSEC, Carnegie Mellon University, Pittsburgh, PA CNRS, Aix-Marseille Univ., CINAM-UPR3118, campus de Luminy, F-13288 Marseille, France Supported by the MRSEC Program of the NSF under award number DMR-0520425 The interfacial properties of metal-metal oxide systems have been of considerable interest over the past several years in applications such as integrated circuits and metal-ceramic joining. The stability of the bond between the metal and the oxide depends in large part on the metal-metal oxide interfacial energy, which is in turn related to the orientation relationships (ORs) at the interface, as well as the microscopic interfacial structure and chemistry. We have used electron backscatter diffraction (EBSD) to determine the orientation relationships between copper and sapphire. Using liquid phase dewetting, in which the copper crystals are produced by nucleation and growth from the liquid phase, preferred orientation relationships (ORs) are found more easily than the more commonly used solid-state dewetting approach. It is also interesting to note that the alignment of the densely packed directions on both sides of the copper-sapphire interface for all of the observed ORs is consistent with the Fecht and Gleiter so-called “lock-in” model for ORs of metals on ionic crystals. Gregory S. Rohrer, Carnegie-Mellon University, DMR 0520425 Figure 1. Secondary electron SEM image of copper particles and, superimposed in color, the EBSD copper map of the identified part of the crystals (because of electron shadowing, only the crests are identified). The color code, on the right, corresponds to the IPF of copper in the [001] direction of the microscope reference frame, which is close to the normal of the sapphire surface. Particles containing grain boundaries (GBs) can be identified by the presence of more than one orientation (color) associated with a specific particle (see arrow).

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