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EDI Gun FM2 Performed Tests and Results. M . Steller Space Research Institute, Graz. Overview EDI Gun Tests. Components Level (valid for all FM’s) Radiation verification tests for bipolar transistors 2N2222 and 2N2907 Up-screening of components for HV opto -coupler

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edi gun fm2 performed tests and results

EDI Gun FM2Performed Tests and Results

M. Steller

Space Research Institute, Graz

IWF/ÖAW GRAZ

overview edi gun tests
Overview EDI Gun Tests
  • Components Level (valid for all FM’s)
    • Radiation verification tests for bipolar transistors 2N2222 and 2N2907
    • Up-screening of components for HV opto-coupler
    • Electrical characterization and thermal cycling of HV opto-coupler
  • Board Level
    • Electrical test
    • Thermal test
  • Electronics Assembly
    • Electrical and functional test
    • Thermal cycling (not performed for FM2)
  • Assembled Gun
    • Short functional test (prior to calibration and transport)
    • Calibration
  • Reports available at: ftp://ftp.iwf.oeaw.ac.at/pub/EDI_MMS/EDI_FM2/GUN/

IWF/ÖAW GRAZ

radiation verification test
Radiation Verification Test
  • NPN Transistor 2N2222
    • Two batches, two different lots
    • Dose rate 25krad/h = 6,94rad/sec
    • First batch: hFE ~150 => ~55 @75 krad
    • Second batch: hFE ~160 => ~25 @ 75krad
  • PNP Transistor 2N2907
    • Two batches, two different lots
    • Dose rate 25krad/h = 6,94rad/sec
    • First batch: hFE ~200 => ~65 @75 krad
    • Second batch: hFE ~145 => ~50 @ 75krad

IWF/ÖAW GRAZ

test assembly hvoc
Test & Assembly HVOC
  • Manufacturing flow
    • Adoption of Ir-LEDs to fit to the HV diode
    • Up-screening by external source
    • Assembly of Ir-LED with HV diode
    • Packing into housing

IWF/ÖAW GRAZ

up screening of hvoc
Up-screeningof HVOC
  • Screening and serialization performed by SACTEC
  • Procedure follows IEEE-INST-002 (EDI-IWF-PRO-0028)
  • Mechanical tests were excluded

Ir-Diode HV-Diode

IWF/ÖAW GRAZ

selection of hvoc
Selectionof HVOC
  • Electrical characterisation
    • Five HV levels 1kV to 5kV
    • Seven current levels for Ir-LED(1, 2, 5, 10, 15, 20, 25mA)
  • Detailed characterisation for selection (since FM3)
    • HV sweep from 0 to 5kV with 100V steps
    • Seven current levels for Ir-LED(1, 2, 5, 10, 15, 20, 25mA)

IWF/ÖAW GRAZ

board level tests
Board Level Tests
  • Electrical Test
    • Board mounted onto dedicated test adapter with spring loaded electrical contacts
    • Standard BLT uses in- and output pins only
    • Additional test points in case detailed measurements necessary
    • Pre-defined step procedures
    • Test is performed semi-automatically
    • Scripts control stimuli and read-out
    • Scripts for generation of graphs

IWF/ÖAW GRAZ

board level test defl1
Board Level Test DEFL1
  • Functional Test
    • Supply current
    • REF voltage to HV controller (D2, D3, D6, D7)
    • Sweep input from 0 to 3.5V
    • Trimming in case deviation is larger than 0.2%
    • Sweep repeated in case of trimming
    • Check of resistor ring (generation of REF voltages)
  • Thermal Test
    • Ambient pressure, -20°C ... 70°C
    • Recording of HV output, HK values and supply currents
  • Report
    • EDI-IWF-REP-0264

IWF/ÖAW GRAZ

results for defl1
Resultsfor DEFL1
  • HV Outputs
    • Deflection D2: 0/+3000V => 0/+2998V
    • Deflection D3 : 0/+3000V => 0/+3004V
    • Deflection D6 : 0/+3000V => 0/+3006V
    • Deflection D7 : 0/+3005V => 0/+2997V
  • Inputs to HV Controller
    • Deflection D2: 998.6V => 997V 2501.4V => 2497V
      • Deflection D3: 998.6V => 998V 2501.4V => 2503V
      • Deflection D6: 998.6V => 999V 2501.4V => 2505V
      • Deflection D7: 998.6V => 996V 2501.4V => 2498V

IWF/ÖAW GRAZ

board level test defl2
Board Level Test DEFL2
  • Functional Test
    • Supply current
    • REF voltage to HV controller (D1, D4, D5, D8)
    • Sweep input from 0 to 3.5V
    • Trimming in case deviation is larger than 0.2%
    • Sweep repeated in case of trimming
    • Check of resistor ring (generation of REF voltages)
    • Check of HK multiplexer (test signal 3.5V)
  • Thermal Test
    • Ambient pressure, -20°C ... 70°C
    • Recording of HV output, HK values and supply currents
  • Report
    • EDI-IWF-REP-0265

IWF/ÖAW GRAZ

results for defl2
Resultsfor DEFL2
  • HV Outputs
    • Deflection D1: 0/+3000V => 0/+3006V
    • Deflection D4 : 0/+3000V => 0/+3002V
    • Deflection D5 : 0/+3000V => 0/+3000V
    • Deflection D8 : 0/+3005V => 0/+3005V
  • Inputs to HV Controller
    • Deflection D1: 998.6V => 999V 2501.4V => 2505V
      • Deflection D4: 998.6V => 999V 2501.4V => 2502V
      • Deflection D5: 998.6V => 997V 2501.4V => 2500V
      • Deflection D8: 998.6V => 999V 2501.4V => 2504V

IWF/ÖAW GRAZ

board level test opt defl
Board Level Test OPT_DEFL
  • Functional Test
    • Supply current
    • REF voltage to HV controller (UD, UI)
    • Sweep input from 0 to 3.5V
    • Trimming in case deviation is larger than 0.2%
    • Sweep repeated in case of trimming
    • Check of HK multiplexer (test signal 3.5V)
    • Calibration of temperature sensor
  • Thermal Test
    • Ambient pressure, -20°C ... 70°C
    • Recording of HV output, HK values and supply currents
  • Report
    • EDI-IWF-REP-0266

IWF/ÖAW GRAZ

results for opt defl
Resultsfor OPT_DEFL
  • HV Outputs
    • U_Deflector: 0/+3000V => -1/+3007V
    • U_Injector: 0/+2000V => 0/+2000V

IWF/ÖAW GRAZ

board level test beam
Board Level Test BEAM
  • Functional Test
    • Supply current
    • REF voltage to HV controller (Anode, Focus, Cathode)
    • Sweep input from -1.5 to 3.5V (range depends on channel)
    • Trimming in case deviation is larger than 0.2%
    • Sweep repeated in case of trimming
    • Timing measurement for chopper circuit
  • Report
    • EDI-IWF-REP-0263

IWF/ÖAW GRAZ

results for beam
Resultsfor BEAM
  • HV Outputs
    • Anode: 0/+3000V => 0/+3001V
    • Focus: 0/-1500V => 0/-1501V
    • Cathode: 0/-1500V => 0/-1498V
  • Chopper
    • Delay: 20.7ns
    • Rise time: <10ns => 2.0ns
    • Fall time: <10ns => 2.9ns

IWF/ÖAW GRAZ

gun electronics assembly 1
Gun Electronics Assembly (1)
  • Integration steps for gun electronics stack
    • Beam board with external harness/ Optics deflection board / HV FIL board
    • First intermediate electrical test
      • Resonance frequency of HV converter, cascade output voltages
      • Functional test of beam and optics deflection
      • Filament supply and Wehnelt driver
    • Deflection1 and deflection 2
    • Second intermediate electrical test
      • Check of external harness
    • Test of deflection system
      • Isolation test
      • Electric strength
    • Installation of deflection system

IWF/ÖAW GRAZ

gun electronics assembly 2
Gun Electronics Assembly (2)
  • Functional test of gun electronics stack
    • Power consumption
    • All HV outputs: sweep from minimum to maximumRecord output and housekeeping
    • Test of chopper signalRise and fall time
    • Test of filament supplyFilament voltage and housekeeping
    • Test of Wehnelt driverVoltage versus HK frequency
    • Derive Anode voltage for beam energy 1keV, 500eV and 250eV
    • Electrode settling time for all HV outputs

IWF/ÖAW GRAZ

results from intermediate tests
Resultsfrom Intermediate Tests
  • Functional test of gun electronics stack
    • Deviation of HV outputs
      • Deflection 2: max. -5V
      • Deflection 3: max. 8V
      • Deflection 6: max. 110V
      • Deflection 7: max. -5V
      • Deflection 1: max. 15V
      • Deflection 4: max. 10V
      • Deflection 5: max. 5V
      • Deflection 8: max. 38V
      • Anode: max. 5V
      • Cathode: max. 4V
      • Focus: max. 9V
    • Chopper signalRise and fall time <10ns: Rise 2.13ns, fall 2.35ns
    • Electrode settling time:<10ms full scale => < 1ms, for all outputs except Cathode

IWF/ÖAW GRAZ

gun calibration
GunCalibration
  • Preparation
    • Installation into chamber
    • Short functional test
    • Pumping after 2 hours OFF time
  • Preparation for Calibration
    • Adjustments for polar angle 0
    • Reference position for movable platform (centre of target)
  • Calibration 1keV, 500eV, 250eV
    • Focus adjustment (0, 20, 40, 60, 80, 90°, 95° polar, every 30° azimuth)
    • Calibration of deflection system
    • Beam profile measurements (same position as focus adjustment)
    • Beam tests: Coding, beam split, maximum beam current

IWF/ÖAW GRAZ

results from calibration
ResultsfromCalibration
  • Calibration table
    • XD, YD for every polar angle ( 2° steps, 1° steps for polar angle above 70°)
    • Corrected polar angle
  • Content of calibration report
    • Deviation from theoretical formula
    • Beam current versus polar angle
    • Spatial deviation from reference
    • Content of calibration table displayed in graphs
    • Beam profiles (2D and 3D graphs)
    • Results from beam test
  • Report
    • EDI-IWF-REP-0281 (0081)

IWF/ÖAW GRAZ