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Explore the complexities of interfacial fracture, stress fields, and processing in electronic packaging and MEMS systems. Learn about thin film growth, damage mechanics, and composite toughness for innovative materials development.
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Interfacial Fracture (Scientists) J.W. Hutchinson J.R. Rice Z. Suo
Stress Oscillation Mode Mixty
MEMS Packaging MicroElectroMechanical Systems
Processing Very Small Peripheral Array (VSPA)
Thin Film Nix
Film Growth Zuqiang Qi Bo Shi
Electroceramics Z. Suo
Damage Mechanics Jean-Louis Chaboche Voyiadjis, G.Z. and Robert Dorgan Gradient formulation in coupled damage-plasticity Archives of Mechanics, 53, 565-597
Composite Toughness EFFECTS OF PULL-OUT ON THE MECHANICAL-PROPERTIES OF CERAMIC-MATRIX COMPOSITES THOULESS MD, EVANS AG ACTA METALLURGICA, 36 (3): 517-522, 1988
Fiber Pull-out Amol Jadhav