1 / 2

Raman spectra (white and green lines)

Acquisition of Surface-Enhanced Confocal Raman-AFM Chang Y. Ryu, Rensselaer Polytechnic Institute, DMR 0722563. AFM surface topography.

steel-rivas
Download Presentation

Raman spectra (white and green lines)

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Acquisition of Surface-Enhanced Confocal Raman-AFMChang Y. Ryu, Rensselaer Polytechnic Institute, DMR 0722563 AFM surface topography The state-of-art confocal Raman-AFM instrument allowed us to simultaneously characterize the topographic morphology and chemical structure information of organic semiconducting materials (e.g. pentacene in the figure). Pentacene has been studied for the flexible display applications as an active layer for organic thin film transistor. We are currently investigating the correlation between the AFM morphology and chemical Raman spectra. X X Raman spectra (white and green lines) H. Yang and C. Y. Ryu et al. J. Phys. Chem. C (2008) To be appeared as a cover article Drain electrode Pentacene layer Source electrode An example of flexible display (Source: Plastic Logic/ www.pbs.org)

  2. Acquisition of Surface-Enhanced Confocal Raman-AFMChang Y. Ryu, Rensselaer Polytechnic Institute, DMR 0722563 Using hack saw blade and laser/frequency generator that are readily available in high school classroom, we have designed the macro tabletop Atomic Force Microscopy (AFM) simulators that have been widely disseminated to high school educators through the collaboration with the “NanoEd” Educational portal site. The students can measure the amplitude of oscillation of reflected LASER light at known coordinates to map out the surface features of the sample. We also participated in “Exploration in Nanoscale Science and Engineering” Workshop at RPI to introduce the AFM simulator to middle/high school students and their parents. http://www.nanoed.org/lessons/Macro_AFM_Simulator/ ▲ Our work “Macro tabletop AFM simulator” was introduced in “NanoEd” Educational Resource Portal site High school physics teacher (Mr. Paul Fedoroff) and I gave a presentation about AFM with a demonstration of the AFM simulator to middle and high students and their parents. ► Explorations in Nanoscale S&E (September, 2007)

More Related