'Timing delay' presentation slideshows

Lecture 18alt I DDQ Testing (Alternative for Lectures 21 and 22)

Lecture 18alt I DDQ Testing (Alternative for Lectures 21 and 22). Definition Faults detected by I DDQ tests Weak fault Leakage fault Sematech and other studies ? I DDQ testing Built-in current (BIC) sensor Summary. Basic Principle of I DDQ Testing.

396 views • 24 slides

Reliable Binary Signed Digit Number Adder Design

Reliable Binary Signed Digit Number Adder Design. Han Liu Supervisor: Seok-Bum Ko Electrical & Computer Engineering Department 2010-Feb-23. Outline. Information of literature Background Carry Free Adder

291 views • 15 slides

Power-Aware FPGA Logic Synthesis Using Binary Decision Diagrams

Power-Aware FPGA Logic Synthesis Using Binary Decision Diagrams. Han Liu Supervisor: Seok-Bum Ko Electrical & Computer Engineering Department 2010-Feb-2. Outline. Information of literature Background FPGA Design Flow

278 views • 13 slides

10/21/2019

280 views • 11 slides