'Thin oxide' presentation slideshows

Radiation damage to electronic devices for LHC and Super-LHC experiments

681 views • 47 slides

ELEC 5270/6270 Fall 2007 Low-Power Design of Electronic Circuits Dynamic and Static Power in CMOS

ELEC 5270/6270 Fall 2007 Low-Power Design of Electronic Circuits Dynamic and Static Power in CMOS. Vishwani D. Agrawal James J. Danaher Professor Dept. of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 vagrawal@eng.auburn.edu

590 views • 41 slides

Laurent Dugoujon (1), Constantin Papadas (2) and Bill Sinnis (2)

A 0.13um CMOS Rad-hard proven technology with associated mixed mode circuit design approaches for space applications. Laurent Dugoujon (1), Constantin Papadas (2) and Bill Sinnis (2) 1) ST Microelectronics, 12 rue Jules Horowitz, B.P. 217, 38019 Grenoble Cedex, France

366 views • 26 slides

Sensor and ASIC R&D

Sensor and ASIC R&D. Sensor Prototype Production: running, ASICs: Switcher, DCD Prototypes under test, DHP: design phase More Information: Indico page of Ringberg Workshop: http://indico.mppmu.mpg.de/indico/conferenceTimeTable.py?confId=466. Sensor Production Status.

338 views • 18 slides

Fabrication and Characterization of Gate-All-Around Silicon Nanowires on Bulk Silicon by V. Pott et al. , IEEE Transac

280 views • 8 slides

VDMOSFET (Vertical Double Diffused Metal Oxide Field Effect Transistor) power device

Rd. Source. 50V. Rg. Gate. Digital scope. Drain. 10V. The measurement circuit. Dependency of Oxide Thickness Effect on the Evolution of n-MOSFET Switching Time with Electrical Stress. C. SALAME 1 , R. HABCHI 1, 2 , B. NSOULI 3 , A. Khoury, and P. MIALHE 2.

197 views • 1 slides