'Test set selection process' presentation slideshows

Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis

Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. Nicholas Imbriglia, Nuno Alves, Elif Alpaslan, Jennifer Dworak Brown University NATW 2010. Motivation. As electronic devices become smaller, they become more and more susceptible to wearout and latent defects:

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