'Scan chain' presentation slideshows

Scan Chain Reorder

Scan Chain Reorder. Sying-Jyan Wang Department of Computer Science National Chung-Hsing University. Outline. Overview Scan chain order: does it matter? Cluster-based reordering for low-power BIST Experimental results Future work. Outline. ? Overview Scan chain order: does it matter?

883 views • 48 slides

EE434 ASIC & Digital Systems

EE434 ASIC & Digital Systems. Jacob Murray School of EECS Washington State University jmurray@eecs.wsu.edu. Test Methodologies. Lecture 32. Conceptual Architecture of Core Test. Three separate elements in the embedded core test infrastructure. Test pattern source and sink

578 views • 42 slides

TEST TIME OPTIMIZATION In Scan Circuits

532 views • 36 slides

Techniques for Test Power Reduction in Leading Edge IP Using Cadence Encounter Test -ATPG:

Techniques for Test Power Reduction in Leading Edge IP Using Cadence Encounter Test -ATPG:. By Praveen Venkataramani. Objective. To reduce dynamic power during test in scan based designs To obtain test vector sequences with minimum switching and pattern count without any loss in test coverage.

351 views • 33 slides

EE 587 SoC Design & Test

EE 587 SoC Design & Test. Partha Pande School of EECS Washington State University pande@eecs.wsu.edu. BOUNDARY SCAN. Motivation for Standard. Bed-of-nails printed circuit board tester gone We put components on both sides of PCB & replaced DIPs with flat packs to reduce inductance

430 views • 32 slides

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard

Lecture 28 IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions Summary. Motivation for Standard. Bed-of-nails printed circuit board tester gone

732 views • 32 slides

BOUNDARY SCAN

BOUNDARY SCAN. IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions. Motivation for Standard. Bed-of-nails printed circuit board tester gone

891 views • 31 slides

BOUNDARY SCAN

BOUNDARY SCAN. IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions. Motivation for Standard. Bed-of-nails printed circuit board tester gone

630 views • 31 slides

Pattern-Directed Circuit Virtual Partitioning for Test Power Reduction

Pattern-Directed Circuit Virtual Partitioning for Test Power Reduction. Dianwei Hu and Dong Xiang Tsinghua University Beijing, China. Qiang Xu The Chinese University of Hong Kong. Outline. Background Pattern-Directed Virtual Partitioning Routing-Aware Virtual Partitioning

407 views • 29 slides

Lecture 26 Logic BIST Architectures

Lecture 26 Logic BIST Architectures. Motivation Built-in Logic Block Observer (BILBO) Test / clock systems Test / scan systems Circular self-test path (CSTP) BIST Circuit initialization Loop-back hardware Test point insertion Summary. Motivation.

463 views • 27 slides

Routing-Aware Scan Chain Ordering

Routing-Aware Scan Chain Ordering. Puneet Gupta and Andrew B. Kahng (Univ. of California at San Diego, La Jolla, CA, USA.), Stefanus Mantik (Cadence Design Systems Inc., San Jose, CA, USA.) Email: { puneet@ucsd.edu , abk@ucsd.edu , smantik@cadence.com }

394 views • 27 slides

Routing-Aware Scan Chain Ordering

Routing-Aware Scan Chain Ordering. Puneet Gupta and Andrew B. Kahng (Univ. of California at San Diego, La Jolla, CA, USA.), Stefanus Mantik (Cadence Design Systems Inc., San Jose, CA, USA.) Email: { puneet@ucsd.edu , abk@ucsd.edu , smantik@cadence.com }

361 views • 27 slides

AES Core Verification using Bounded Model Checking and SAT

AES Core Verification using Bounded Model Checking and SAT. EECS 578 Final Project Phil Nevius Paul Lee Vashist Vasanthakumar. Agenda. Motivation Intro to AES Core Application of BMC SAT solver Properties Results Conclusion Future Work. Motivation.

485 views • 25 slides

JTAG Boundary Scan

JTAG Boundary Scan. IEEE 1149.1 JTAG Boundary Scan Standard. Motivation Bed-of-nails tester System view of boundary scan hardware Elementary scan cell Test Access Port (TAP) controller Boundary scan instructions Summary. Motivation for Standard.

1.28k views • 24 slides

404 views • 23 slides

SoCKs Flow: Here, There, and Back Again

SoCKs Flow: Here, There, and Back Again. Apala Guha, Jerry Qi, Mateja Putic, Adam Cabe 12/13/06 ECE 686: SoC Design. SoCKs. Hardware / Software co-design env. Leon SPARC Core AMBA bus Custom Logic Compile software that uses custom logic HDL, test benches, and C compiler provided.

335 views • 19 slides

System JTAG 24 th May 06 Southampton Presented By Stephen Harrison steve.harrison@motorola

278 views • 15 slides

Low Power Implementation of Scan Flip-Flops

Low Power Implementation of Scan Flip-Flops. Chris Erickson Graduate Student Department of Electrical and Computer Engineering Auburn University, Auburn, AL 36849 Chris.Erickson@auburn.edu. Objectives. Scan flip-flop overview Ways to incorporate low power design Benchmark circuit Results.

294 views • 14 slides

STT-RAM Test Chip #1

208 views • 12 slides

UNLOCKING THE POWER OF BOUNDARY-SCAN

UNLOCKING THE POWER OF BOUNDARY-SCAN. World Wide Users. 3Com ABB August Systems AGFEO Alcatel AscomTelecom. Atlas Copco Barco Graphics Blaupunkt Bofors Celestica Compaq Datex ECI EKB. Ericsson Ericsson Intracom Force Computer Fujitsu Microelectronics Fujitsu Telecom

259 views • 12 slides