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Scan cell - PowerPoint PPT Presentation

Board-level testing and IEEE1149.x Boundary Scan standard

Board-level testing and IEEE1149.x Boundary Scan standard. Artur Jutman artur@ati.ttu.ee August 2010. IEEE 1149.1 Boundary Scan Standard. Board level testing challenges Fault modeling at board level (digital) Test generation for interconnect faults IEEE 1149.1 Boundary Scan Standard

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664 views • 62 slides

Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects

International Test Conference Santa Clara , CA, Oct 26-Oct 31, 2008. Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects.

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492 views • 25 slides

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL)

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL). Special scan cells and pins Cell timing / wiring constraints Cell delay measurements Boundary Scan Description Language Summary. Observe-Only Scan Cell. Control & Observe Scan Cell. Bidirectional Pins.

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548 views • 21 slides

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Scan cell - PowerPoint PPT Presentation

Board-level testing and IEEE1149.x Boundary Scan standard

Deterministic Diagnostic Pattern Generation (DDPG) for Compound Defects

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan &amp; Description Language (BSDL)

Lecture 29 IEEE 1149.1 JTAG Advanced Boundary Scan & Description Language (BSDL)