'High speed vlsi testing' presentation slideshows

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT. Available automatic test equipment (ATE) speed is 100-200MHz; VLSI chip speed is 0.5-1GHz. Expensive to replace the existing ATE. Besides, chip speed remains an advancing target. Existing delay test solutions insert hardware into chip

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