'High fault coverage' presentation slideshows

Testing Semiconductor Memories

Testing Semiconductor Memories. Cheng-Wen Wu ???. Lab for Reliable Computing Dept. Electrical Engineering National Tsing Hua University. Outline. Introduction RAM functional fault models and test algorithms RAM fault-coverage analysis Cocktail-March for testing word-oriented memories

2.56k views • 180 slides

Design for Testability

Design for Testability. ??? (03)5773693#157 jbchen@cic.org.tw. Agenda. Logic Testing Basic Concept Design for Testability RTL Rule Checker DFT Guidelines and Rules Synopsys DFT Design Flow Memory Testing Basic Concept Memory BIST SynTest SRAMBIST Flow.

2.94k views • 115 slides

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS

ECE 553: TESTING AND TESTABLE DESIGN OF DIGITAL SYSTEMS. Design for Testability (DFT) - 1. Overview. Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overhead Scan design system Summary. Definition.

274 views • 27 slides

DSM DTMROC version for the ATLAS TRT System Overview

377 views • 26 slides

VLSI Testing Lecture 13: DFT and Scan

VLSI Testing Lecture 13: DFT and Scan. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 31, 2012, 3:00-4:00PM. Contents. Definitions

252 views • 25 slides

VLSI Testing Lecture 10: DFT and Scan

VLSI Testing Lecture 10: DFT and Scan. Definitions Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Boundary scan Summary. Definitions.

726 views • 24 slides

VLSI Testing Lecture 10: DFT and Scan

VLSI Testing Lecture 10: DFT and Scan. Definitions Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Boundary scan Summary. Definitions.

252 views • 24 slides

Lecture 23 Design for Testability (DFT): Full-Scan

Lecture 23 Design for Testability (DFT): Full-Scan. Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Scan design system Summary. Definition.

427 views • 22 slides

Lecture 23 Design for Testability (DFT): Full-Scan

Lecture 23 Design for Testability (DFT): Full-Scan. Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Scan design system Summary. Definition.

487 views • 22 slides

Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence)

Lecture 23 Design for Testability (DFT): Full-Scan (Lecture 19alt in the Alternative Sequence). Definition Ad-hoc methods Scan design Design rules Scan register Scan flip-flops Scan test sequences Overheads Scan design system Summary. Definition.

221 views • 22 slides

?? ??

?? ??. ???? ??? 961428 ??? 961556 ???. The compitition. ?????????????????????????? (CAD) ??????? ????? ????? ?? ??? Multi-Core ATPG. ATPG. acronym for both A utomatic T est P attern G eneration and A utomatic T est P attern G enerator

295 views • 14 slides