'Focused ion beam' presentation slideshows

Electron beam lithography (EBL)

Electron beam lithography (EBL). Overview and resolution limit. Electron source (thermionic and field emission). Electron optics (electrostatic and magnetic lens). Aberrations (spherical, chromatic, diffraction, astigmation). EBL systems (raster/vector scan, round/shaped beam).

1.49k views • 42 slides

THE TRACK NANOTECHNOLOGY

THE TRACK NANOTECHNOLOGY. Dr. David Forsyth British Institute of Technology & E-commerce (BITE). structure of talk:.

569 views • 21 slides

S. Frabboni (3) , A. Gabrielli (1,2) , G.C. Gazzadi (3)

Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment. S. Frabboni (3) , A. Gabrielli (1,2) , G.C. Gazzadi (3) F. Giorgi (1) , G. Matteucci (2) , G. Pozzi (2) , N. Semprini (1,2) , M. Villa (1,2) , A. Zoccoli (1,2).

232 views • 14 slides

Characterizing InGaAs quantum dot chains

APS 4CS New Mexico Institute of Mining and Technology Socorro, NM October 26-27, 2012. Characterizing InGaAs quantum dot chains. Tyler Park John Colton Jeff Farrer Ken Clark David Meyer Scott Thalman Haeyeon Yang. Outline. Quantum dot (QD) overview

359 views • 13 slides

San Jose State University Nanoscale Materials and Device Characterization Program

San Jose State University Nanoscale Materials and Device Characterization Program. Defense Microelectronics Activity Research Review Task Quad Charts DMEA Co-operative Agreement #H94003-06-2-0605 March 14, 2007 PI: Emily L. Allen emily.allen@sjsu.edu.

250 views • 9 slides

Characterization of quantum dot chains using transmission electron microscopy

Characterization of quantum dot chains using transmission electron microscopy. Tyler Park Jeffrey Farrer John Colton Haeyeon Yang. APS March Meeting 2012, Boston. * Special thanks Felipe Rivera and Thomas McConkie for sample preparation (FIB/SEM). Introduction.

226 views • 9 slides

Critical Fields and Currents in SmFeAs (O,F) Microdevices Gregory S. Boebinger , Florida State University, DMR 0654118 Pulsed Field Facility User Program, LANL.

183 views • 2 slides

Date and venue

175 views • 2 slides

Seed-IV Highlight: Single atom-thick nano sensors

141 views • 1 slides