'Fault detections' presentation slideshows

Failure Detection: Worth it? Masking vs Concealing Faults

639 views • 48 slides

Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis

Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis. Nicholas Imbriglia, Nuno Alves, Elif Alpaslan, Jennifer Dworak Brown University NATW 2010. Motivation. As electronic devices become smaller, they become more and more susceptible to wearout and latent defects:

363 views • 27 slides