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BUILDING A LOW COST LISN FOR EMI TESTS

BUILDING A LOW COST LISN FOR EMI TESTS. Presenter: Fernando Soares dos Reis Pontifical Catholic University of the Rio Grande do Sul Brazil. Table of Contents. INTRODUCTION OBJECTIVES TERMS AND DEFINITIONS - EMC, EMI CONDUCTED EMI LINE IMPEDANCE STABILIZATION NETWORK

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BUILDING A LOW COST LISN FOR EMI TESTS

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  1. BUILDING A LOW COST LISN FOR EMI TESTS Presenter: Fernando Soares dos Reis Pontifical Catholic University of the Rio Grande do Sul Brazil V Conferência de Aplicações Industriais

  2. Table of Contents • INTRODUCTION • OBJECTIVES • TERMS AND DEFINITIONS - EMC, EMI • CONDUCTED EMI • LINE IMPEDANCE STABILIZATION NETWORK • PRACTICAL IMPLEMENTATION • EXPERIMENTAL RESULTS • CONCLUSIONS V Conferência de Aplicações Industriais

  3. INTRODUCTION Some examples of problems caused by EMI: • Pistol Drill may Interfere on TV; • Electronic Ballast's may change the TV channel; • Switching Inductive Load may generate noise in Radios; Necessity of accordance with Standards... V Conferência de Aplicações Industriais

  4. The simulation tool V Conferência de Aplicações Industriais

  5. Simulation Tool Results V Conferência de Aplicações Industriais

  6. Experimental Results V Conferência de Aplicações Industriais

  7. OBJECTIVES In this paper will be presented a methodology for implementation of a Line Impedance Stabilization Network - LISN, symmetric commutable, in accordance with the specifications of the Normative IEC CISPR 16-1, using easily acquirable components in the electro-electronic stores. The Line Impedance Stabilization Network is used for conducted EMI tests in equipment’s witch current is not above 16 A. V Conferência de Aplicações Industriais

  8. TERMS AND DEFINITIONS Electromagnetic Compatibility - EMC: • It´s the characteristic presented by an equipment, or system, working satisfactorily, in an electromagnetic environment without causing or suffering unacceptable degradation in its individually designed function. V Conferência de Aplicações Industriais

  9. COMMUNICATIONENVIRONMENT EMC EMI V Conferência de Aplicações Industriais

  10. TERMS AND DEFINITIONS Electromagnetic Interference – EMI • Any electromagnetic disturbance that interrupts, obstructs, or otherwise degrades or limits the effective performance of electronics/electrical equipment. It can be induced intentionally, as in some forms of electronic warfare, or unintentionally, as a result of spurious emissions and responses, intermodulation products, and the like. Also called radio frequency interference RFI. V Conferência de Aplicações Industriais

  11. INDUSTRIAL ENVIRONMENT EMI EMC V Conferência de Aplicações Industriais

  12. ALCA MERCOSUL EUROPEAN UNION By Globalization´s Highway...International Rules... V Conferência de Aplicações Industriais

  13. GLOBALIZATIONS • IEC - International Electrotechnical Commission; • CISPR - International Special Committee on Radio Interference; • CENELEC - Committee for Electrotechnical Standardization; • These organizations prepares and publishes international standards for all electrical, electronic and related technologies; V Conferência de Aplicações Industriais

  14. ELECTRONICS LOADS CONSUMERS REQUIREMENTS • IN THE LAST YEARS THE ELECTRONIC LOADS GROW UP OVER THE WORLD • BRAZIL WAS NOT AN EXEPTION AT THIS PROCESS EMC ELECTRONICS LOADS V Conferência de Aplicações Industriais

  15. Basic Categories for EMC ELECTROMAGNETIC COMPATIBILITY EMISSION SUSCEPTIBILITY CONDUCTED CONDUCTED IRRADIATED IRRADIATED ELECTROSTATIC POWER FLUTUATION HARMONICS RADIO-INTERFERENCE V Conferência de Aplicações Industriais

  16. Conducted EMI test Difficulties for realization of the tests Few test Facilities (in Brazil and South America); Test apparatus are very expensive; Technical Capacity; Standards Interpretation; V Conferência de Aplicações Industriais

  17. Line Impedance Stabilization Network Interference Measurer Dipole Antenna EMI Receptor LISN I inter... U inter.. P 30 to 1000 MHz inter.. According to VDE 0871 e FCC 10 kHz to 30 MHz According to VDE 0871 450 kHz a 30 MHz H According to FCC 15 inter.. Interference supply Telescopic Antenna Loop Antenna E inter.. 10 kHz to 30 MHz Not Required by VDE According to VDE 0871 EMC V Conferência de Aplicações Industriais

  18. 2 X 3 X X Antenna E U T Open Area Test Site V Conferência de Aplicações Industriais

  19. IRRADIATED EMI MEASURING PROCEEDINGS Antenna EUT 4 m EMI Receiver 1 m 1 m Ground Plane 3 m 10 m 30 m 100 m V Conferência de Aplicações Industriais

  20. 100 100 90 90 Limit Value Limit Value 79 80 80 class A Quasi-peak (class A) dB 73 70 70 µV 70 66 dB 56 60 60 Limit Value 60 60 µV class B 50 48 50 Quasi-peak (class B) 40 40 30 30 0.01 0.1 0.45 1 1.6 MHz 30 10 5 30 MHz 0.15 0.5 10 0.9 LIMIT STANDARDS CISPR 11 FCC 15 Class A. A device that is marketed for use in a commercial, industrial or business environment; Class B A device that is marketed for use in a residential environment notwithstanding use in commercial, business and industrial environments; V Conferência de Aplicações Industriais

  21. CONDUCTED EMI It is the part of the electromagnetic interference that flows by power cords. This kind of interference can be propagated in: • Differential Mode (DM) or in • Common Mode (CM) V Conferência de Aplicações Industriais

  22. CONDUCTED EMI IN DIFERENTIAL MODE Phase Z i LISN CDM Equipment Neutral V Conferência de Aplicações Industriais

  23. CONDUCTED EMI IN COMMON MODE Phase Z i LISN CCM Equipment Neutral Ground - Common Parasitic Capacitors V Conferência de Aplicações Industriais

  24. LABORATORY TESTS FACILITIES Equipment Under Test (EUT) and Measurements Apparatus Conductive Surface Connected to Gnd EMI Receiver Equipment Under Test 40 cm LISN 80 CISPR 16 80 cm cm Layout for conducted emissions tests V Conferência de Aplicações Industriais

  25. SIMULATION OF THE LISN CHARACTERISTICS CISPR 16 ± 20 % Maximum Tolerance LISN Fre. Imp. LISN  kHz EMI Receptor 10 5,4 Impedance 50µH 40 20 7,3 cm 80 21 50 5 80 150 33 80 cm cm 300 43 800 49 10000 50 Frequency (MHz) V Conferência de Aplicações Industriais

  26. IMPLEMENTED LISN To The EUT 50 µH 250 µH 250 nF Phase 4 µF 8 µF EMI Reveiver Mains 10 W 1 kW 5W Gnd 10 W 5W 1 kW 50 W 8 µF 4 µF Neutral 250 µH 50 µH To The EUT 250 nF V Conferência de Aplicações Industriais

  27. Inductor of the 50 mH V Conferência de Aplicações Industriais

  28. Inductor of the 50 mH The inductor is a coil with 35 turns, shaping one only layer of Æ6mm enameled wire. The step of this coil is 8 mm, rolled in an isolating core of (150 mm) 130 mm or 5 inches x 280 mm as the IEC CISPR 16-1 regulations indicates. The wire diameter is the dimension that considers to minimize the inductors resistive component. However, the coil built was fashioned using a Æ4 mm wire, because the current from the test equipment's is under 5A. V Conferência de Aplicações Industriais

  29. Inductor of the 50 mH The step rolling control of the inductor was made using a Æ4 mm fishing string (nylon) between each espire. V Conferência de Aplicações Industriais

  30. Inductor of the 50 mH To suppress internal resonance in this inductor the IEC CISPR 16-1 regulation, establishes that 430 W ± 10% being connected between the espires 4 and 8, 12 and 16, 20 and 24 and 26 and 32 as showed. V Conferência de Aplicações Industriais

  31. Inductor of the 50 mH To obtain a 430 W resistance, which is not commercial it was associated in parallel a 470 W resistor with another of 4700 W. V Conferência de Aplicações Industriais

  32. LISN Assembled on a PC Rack V Conferência de Aplicações Industriais

  33. EXPERIMENTAL RESULTS LISN - EXPERIMENTAL RESULTS Regulation Phase Neuter Zmin Zmax V Conferência de Aplicações Industriais

  34. CONCLUSIONS The mainly point of this work is in the fact of making more accessible the EMI tests realization, diminishing the assembling costs in EMI test facilities, reflecting even by academic or industrial environment. V Conferência de Aplicações Industriais

  35. CONCLUSIONS The components utilized to build the Artificial Network are easily acquired, because they are not specific for this usage. The only problem to use Artificial Networks is the calibration factor. V Conferência de Aplicações Industriais

  36. The End V Conferência de Aplicações Industriais

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