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Chip Resistor Inspection on Substrate: Quality Assurance with High Throughput

This presentation introduces a chip resistor inspection system for substrates, offering benefits such as inspecting various packages, high throughput, stroke analysis for marking inspection, accurate measurements, user-selectable package dimensions, enhanced defect visibility through lighting design, cost-effective quality assurance, consolidated reporting, and user-friendly operation with a quick learning curve.

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Chip Resistor Inspection on Substrate: Quality Assurance with High Throughput

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  7. PRESENTATION START

  8. CRIS SERIESChip Resistor Inspection on Substrate Key benefits • Inspects wide range of packages • High throughput up to 2.5 secs / substrate • Mark inspection using stroke analysis • High accuracy measurement and comprehensive package dimensions selectable by user • Propreitary lighting design to enhance hard to see defects • Immediate quality assurance cost effectively and flexible configuration • Consolidated inspection report and comprehensive reporting format • Ease of use and fast learning curve

  9. Vision Inspection

  10. Vision Inspection One click to auto segment and learn the characters !! Good System detects broken 0 and extra ink on 5 !! Bad

  11. Vision Inspection Darker defect Lighter defect Darker defect

  12. Vision Capabilities

  13. Laser Cut

  14. Process Vision Inspection Pass ? Yes Inspect Print Registration Inspect Mark Quality Inspect Surface Defects Produce Report No Laser Cut Yes Any bad resistors ? Fail Bins Laser cut bad resistors No Pass Bin Cycle Time = 2.5 secs / substrate

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