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Two Components contribute to the power dissipation: Static Power Dissipation Leakage current Sub-threshold current Dynamic Power Dissipation Short circuit power dissipation Charging and discharging power dissipation. Power Dissipation in CMOS. Static Power Dissipation. VDD.

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Power Dissipation in CMOS


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    1. Two Components contribute to the power dissipation: Static Power Dissipation Leakage current Sub-threshold current Dynamic Power Dissipation Short circuit power dissipation Charging and discharging power dissipation Power Dissipation in CMOS

    2. Static Power Dissipation VDD • Leakage Current: • P-N junction reverse biased current: • io= is(eqV/kT-1) • Typical value 0.1nA to 0.5nA @room temp. • Total Power dissipation: • Psl= i0.VDD • Sub-threshold Current • Relatively high in low threshold devices S G B MP D Vin Vo D G B MN S GND

    3. Analysis of CMOS circuit power dissipation • The power dissipation in a CMOS logic gate can be • expressed as • P = Pstatic + Pdynamic • = (VDD · Ileakage) + (p · f · Edynamic) • Where p is the switching probability or activity factor • at the output node (i.e. the average number of output • switching events per clock cycle). • The dynamic energy consumed per output switching event is defined as Edynamic =

    4. Analysis of CMOS circuit power dissipation The first term —— the energy dissipation due to the Charging/discharging of the effective load capacitance CL. The second term —— the energy dissipation due to the input-to-output coupling capacitance. A rising input results in a VDD-VDD transition of the voltage across CM and so doubles the charge of CM. CL = Cload + Cdbp +Cdbn CM = Cgdn + Cgdp

    5. The MOSFET parasitic capacitances • • distributed, • • voltage-dependent, and • • nonlinear. • So their exact modeling is quite complex. Even ESC can be modeled, it is also difficult to calculate the Edynamic. On the other hand, if the short-circuit current iSC can be Modeled, the power-supply current iDD may be modeled with the same method. So there is a possibility to directly model iDD instead of iSC.

    6. Schematic of the Inverter

    7. Analysis of short-circuit current The short-circuit energy dissipation ESC is due to the rail-to-rail current when both the PMOS and NMOS devices are simultaneously on. ESC = ESC_C + ESC_n Where and

    8. Charging and discharging currents • Discharging Inverter Charging Inverter

    9. Factors that affect the short-circuit current For a long-channel device, assuming that the inverter is symmetrical (n = p =  and VTn = -VTp = VT) and with zero load capacitance, and input signal has equal rise and fall times (r = f = ), the average short-circuit current [Veendrick, 1994] is From the above equation, some fundamental factors that affect short-circuit current are:  , VDD, VT,  and T.

    10. Parameters affecting short cct current For a short-channel device,  and VT are no longer constants, but affected by a large number of parameters (i.e. circuit conditions, hspice parameters and process parameters). CL also affects short-circuit current. Imean is a function of the following parameters (tox is process-dependent): CL, , T (or /T), VDD, Wn,p, Ln,p (or Wn,p/Ln,p ), tox, … The above argument is validated by the means of simulation in the case of discharging inverter,

    11. The effect of CL on Short CCt Current

    12. Effect of tr on short cct Current

    13. Effect of Wp on Short cct Current

    14. Effect of timestep setting on simulation results

    15. Thank you !