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This chapter delves into the process of developing and applying alternate test solutions to meet specific cost, time, and quality goals. It covers modifying designs, determining test stimulus range, optimizing DfT features, generating response signatures, evaluating goal metrics, and more. Through a structured approach, the text explores how to compare solutions, deal with outliers, recalibrate mappings, and build correlation models for improved performance metrics.
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(b) Alternate Test Application (a) Alternate Test Development Given goals for test cost, test time and test quality Fig. 12.32 DfT features Modify design Determine test stimulus range Determine possible DfT features Stimulus Apply Stimulus (1) Tweak models Create optimization models (2) Generate a sample set of DUT models (3) Re-sample (4) Optimize test stimulus Optimize measurement Optimize DfT features Generate response signature Response Mappings (5) Evaluate goal metric Predict Specifications Metric not met Alternate Test Solution: Stimulus, DfT, Response Signature Compare w/ limits Produce a sample set of physical DUTs # of Outliers > Limit (6) PASS FAIL OUTLIER Recalibrate Mapping (7) Outlier List Bin as Outlier Measure specifications using classical tests Make measurements using alternate test Kick back to classical tests (8) Build correlation models PASS FAIL Mapping Functions
Fig. 12.40 SNR SFDR dB dB dB dB Third Harmonic dB dB dB