XTRP Hardware
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This report outlines the development and testing infrastructure for the XTRP hardware systems at the University of Illinois. It details the setup of the XTRP test stands, encompassing various VME crates, data boards, clock boards, and custom backplane configurations. Initial power-up and signaling tests proved successful, enabling extensive VME transactions and system integration processes. The document also highlights improvements in mechanical compliance, software development, and error-checking methodologies to ensure the reliability of clock and data operations. It sets targets for future hardware integration and continued testing.
XTRP Hardware
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XTRP Hardware Mike Kasten University of Illinois 2/24/00
2 XFT linkers CDF clock L1 calorimetry L1 muon L2 trigger SVT Data board transition module (x12) Clock/control transition module Level1 Request Clock/control board Track Data Data board (x12) 30° (2 wedges) Data boards (duplicates) 132 ns + 33ns clocks 12 data boards XTRP I/O The core XTRP System Internal communication
XTRP Teststand #1: Pre-crate • Custom Backplane • Initial power-up • Boot PROM • VME emulation • Signals via Unidig Module • C code • Power measurement U of Illinois
XTRP Teststand #1: VME crate • Successfully completed VME transactions • Write/Read registers • Load extrapolation RAMs • Benchtop accessibility & VME emulation were extremely helpful for initial debugging • This teststand will provide initial testing infrastructure for new VME boards
XTRP Teststand #2: VME crate • VIPA-style Test Crate at U of Illinois • VME access • Write/Read registers • Load extrapolation RAMs • Multi-board system • Controller / TestClock / Clock Control / Data • Send clock signals from Clock Board to Data Board • Step data through Data Board (slow clock) • Software Development • DataBSim.java (Data Board simulator) • XtrpExpertPanel.java (Test engine)
XTRP Functional Clock Test TestClock CLOCK TEST 132ns, 33ns, Sync Signals 132ns Clock Data Board Clock Board VME write (+Test Clock) 132ns, 33ns, Sync Signals
Functional DataTestProcedure • Set up Data Board & Clock Board • Repeat N times: • Load XFT Simulation data into Data Board • Increment Data Board clock via Clock Board • Increment Simulator • Compare Data Board versus Simulator • Debug
XTRP Functional Data Test VME write XFT Simulation Data VME write Test Clock Data Board Clock Board STEPPED 132ns, 33ns, Sync Signals VME read & compare to Simulation
XTRP Teststand #2: VME crate • Data Board II is necessary • simple reroutes: ~100 • power supply pins (64 identical ICs ) • various • Mechanical compliance • Improvements (JTAG & buffering) • Data Board I lives on… • Completely Functional • Acceptable to use for B0 integration tests • Clock Control Board is OK (so far) • Corrections do exist: ~25 total wires • Relayout not planned
XTRP Teststand #3: Wilson Hall • Multi-crate system • XFT CDF-style Crate • Test Clock / Clock Splitter / Controller / TRACER • LinkerTester • Linker / Output Modules • XTRP VIPA-style Crate • Controller / TRACER • Data Board • Clock Control Board • Much much more Software Development
XTRP Tests DATA TEST >1,000,000 clocks error free Linker(2) Output Formatters VME write VME read & compare to Simulation Data transferred at full speed for 250 clocks VME read from Pipe FPGAs Linkertester Input Fifos Data Board CAL/MUON Data INPUT TEST >100,000,000 clocks errors: x000000 to xFFFFFF
XTRP Tests VME write Output Fifos Linkers (2) Linkertesters (2) Data transferred at full speed for 10k clocks VME read & compare to Simulation Data Board Input Fifos >10,000,000 clocks error free
XTRP Tests VME write Output Fifos Linkertester Data Board Data transferred at full speed for 10k clocks VME read & compare to Simulation Input Fifos Software under development
XTRP Teststand #3: Wilson Hall • Data Board I • No more layout errors found • Data Board Transition Module - new board necessary • wiring corrections: ~5 • PCB footprint for Muon connector is wrong • Clock Board • No more layout errors found • Clock Board Transition Module - new board necessary • Errors found independent of testing
Plan for New Hardware • Data Board II • Quotes requested, waiting for responses • Contract Assembler reviewing BOM • Target date for 1st DBII: April 1, 2000 • Data Board Transition Module • Want to connect to Muon & Calorimetry systems first • Target date for new TM: April 15, 2000 • Clock Board Transition Module • Need a new board for SVT & L2P integration • Target date for new TM: May 1, 2000
Input Test Error x000000 to xFFFFFF Linker(2) Output Formatters Backplane Data Board Transition Module Data Board 3.3V LVDS Receiver 3.3V LVTH Latch xFFFFEF Error seen on only 1 out of 96 bits xFFFFFF