Analysis of Sub-Micron Metal Particles By Proximal Excitation of X-rays: Proximal XPS Christopher F. Mallinson Department of Mechanical Engineering Sciences The Surface Analysis Laboratory 2nd July 2014
Introduction With the increasing interest in the health and safety issues associated with the use and emission of small particles, there is a need for the chemical analysis of sub-micron sized particles. Thermo Scientific Microlab 350 Scanning Auger Microscope
What is Proximal XPS and How is it Performed? • Conditions: • 15 kV beam energy • Beam just off the particle, • 200 -300 nm • Tilt sample 40° from • sample normal Schematic of analysis set up in Scanning Auger Microscope
Results from Copper Particle 500 x 800 nm particle α*copper particle = 1852.3 eV indicative of copper (II) oxide
Results from Iron Particle 500 x 800 nm particle
Take Home Message • Locally generated X-rays have been used to analyze sub-micron metal particles to obtain chemical information. • Further work is needed to improve the technique to achieve more reliable results. Thank you for listening Any Questions?