bi review on radiation development and testing
Download
Skip this Video
Download Presentation
BI Review on Radiation Development and Testing

Loading in 2 Seconds...

play fullscreen
1 / 28

BI Review on Radiation Development and Testing - PowerPoint PPT Presentation


  • 127 Views
  • Uploaded on

BI Review on Radiation Development and Testing. SPS Beam Position Monitors: MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013. Outline. SPS Multi Orbit POsition System (MOPOS) System overview Front-End Architecture Rad- tol requirements, design and status

loader
I am the owner, or an agent authorized to act on behalf of the owner, of the copyrighted work described.
capcha
Download Presentation

PowerPoint Slideshow about 'BI Review on Radiation Development and Testing' - iliana


An Image/Link below is provided (as is) to download presentation

Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author.While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server.


- - - - - - - - - - - - - - - - - - - - - - - - - - E N D - - - - - - - - - - - - - - - - - - - - - - - - - -
Presentation Transcript
bi review on radiation development and testing

BI Review on Radiation Development and Testing

SPS Beam Position Monitors:MOPOS Front-End Electronics

Jose Luis Gonzalez

BE/BI

22/11/2013

outline
Outline
    • SPS Multi Orbit POsition System (MOPOS)
    • System overview
    • Front-End Architecture
  • Rad-tol requirements, design and status
  • Possible impact and mitigation
  • Long-term radiation test planning and strategy

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

sps multi orbit position system mopos
TT20

(SPS NA)

BA2

BA3

BA4

ECA4

BA1

TT40

BA5

TT66

(HiRadMat)

BA7

TI2

(LHC)

ECA5

TT60

BA6

TT41

(CNGS)

TT10

(PS)

TI8

(LHC)

SPS Multi Orbit POsition System (MOPOS)
  • MOPOS Front-End
    • 216 BPMs in the tunnel
    • Exposed up to 100Gy/y
    • Optical transmission
  • MOPOS Read-Out
    • In surface buildings (BA1...6)

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

mopos simplified block diagram
MOPOS: Simplified Block Diagram

y

U

Serial

ADC 10MHz

FPGA

LogAmps

L

R

Optical Link

@ 2.4 Gb/s

Pickup

x

D

Analogue Board

Digital Board

SPS Tunnel

FPGA

Front-End

CHASSIS

Radio Frequency

Timing Distribution

VME Interface

Software

Read-Out Board

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

front end architecture
Front-End Architecture

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

analogue board
Analogue Board
  • Log-Amps
    • AD8302
    • ADL5519
    • MAX2016
  • ADC Drivers
    • ADA4932-2
    • THS4521
  • Voltage regulators
    • LT1963AEQ
    • TL1963-KTT
    • LP3875-ADJ
    • TPS7A4501-KTT

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

psi irradiation facilities pif
PSI Irradiation Facilities (PIF)
  • Energy: 230 MeV
  • Flux: 1.6 108 p/cm2 s
  • Fluence: 1.874 1012 p/cm2
  • Current: 4.7 nA
  • Collimator: 58 mm (Si)
  • Dose/run: 1 kGy - 105 rad/3.5 h

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

psi analogue test setup
PSI: Analogue Test Setup

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

logamp adl5519 adc drivers
LogAmp ADL5519 & ADC-Drivers

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

analogue components
Analogue Components
  • LogAmps
    • AD8302: Analog Devices, Dual Log Amps
    • ADL5519: Analog Devices, Dual Log Detector
    • MAX2016: Maxim, Dual Log Detector
  • ADC Drivers
    • ADA4932: Analog Devices, Differential ADC driver
    • THS4521: Texas Inst., Differential ADC driver
  • These components have been qualified at PSI (TID 1kGy)

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

voltage regulators
Voltage Regulators

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

analogue components1
Analogue Components
  • Low Dropout Regulators
    • LT1963A: Linear Tech.,LDO Regulator (1/3 bad)
    • LP3875: National Semi., LDO Regulator (3/3 bad)
    • TL1963A: Texas Inst.,LDO Regulator
    • TPS7A4501: Texas Inst.,LDO Regulator
  • These components have been qualified at PSI (TID 1kGy)

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

optical transceivers test board
Optical Transceivers Test Board

Commercial SFP Modules

  • Double-fiber SFP
    • FTTX Technology: FT3A05D
  • Single-fiber, bidirectional
    • Ligent: LTE5350-BC and LTE3550-BC
    • Lightron: WSP24-313LC-I5A and WSP24-513LC-I3A
    • Source Photonics: SPL-35-GB-CDFM and SPL-53-GB-CDFM
    • Yamasaki: 541315L-15B and 541315L-15Y

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

psi test setup
PSI Test Setup
  • Energy: 230 MeV; Current: 2nA (~3.5 rad/s) or 3 nA(~6 rad/s); Collimator: 58 mm (Si)
  • TID goal: 1 kGy - 105 rad/component
  • Measurements every second:
      • Communication rate: 1.25 Gb/s
      • 32-bit word sent from the controller board (FPGA, Spartan6)
      • Electrical loopback on the SFP Board
      • Cross-check between sent and received 32-bit word
      • 2 SFP modules tested in parallel
      • For each channel, 3 counters are enabled: single bit errors, multiple bit errors, total errors

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

measurements best sfp parts
Measurements – Best SFP Parts

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

sfp test results summary
SFP Test Results Summary
  • Ligentand Yamasaki components are very sensitive to the radiation level @ PIF
    • Source-Photonics components are more resistant but with many error bursts
    • FTTX and Lightron components behave much better but still generate many error bursts
  • For the MOPOS Front-End: decision to use the Versatile Transceiver (VTRx) developed at CERN

TESTS to be done with long transmission fibres (up to 1.5 km)

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

cern vtrx radiation specs
CERN VTRx Radiation Specs

Versatile Link Technical Specification, rev. 2 [J. Troska et al.]

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

short term strategy
Short-Term Strategy
  • Current Front-End Digital PCB (vers. 1)
    • Analog Devices Octal14-bit ADC: AD9252
    • Xilinx Spartan6 FPGA (Triplication, Hamming Code Correction…)
    • CERN VTRX Optical Transceiver
  • Will allow the first functional tests of the MOPOS system in 2014 (both hardware and software)

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

long term strategy radiation tests for adc digital parts
Long-Term Strategy: Radiation Tests for ADC & Digital Parts
  • Beam Tests Conditions: equivalent to PSI Test Beams (230 MeV; TID: 1 kGy)
  • In our section there is no manpower available in 2014

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

analogue digital converters
Analogue/Digital Converters
  • 40…65Msps – LVDS Serial ADC
    • AD9252: Analog Devices Octal 14-bit
    • AD9259: Analog Devices Quad 14-bit
    • LTM9009: Linear Tech.Octal 14-bit
    • LTC2171: Linear Tech.Quad 14-bit
    • ADS5294: Texas Inst. Octal 14-bit
    • ADS6442: Texas Inst. Quad 14-bit

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

adc radiation tests h takai bnl
ADC Radiation Tests (H. Takai/BNL)

TWEPP2013

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

digital components
Digital Components
  • Low Voltage and LVDS Buffers
    • 74VCX162244: Fairchild 16-bit Buffer/Line Driver
    • 74ALVCH162244: Texas 16-bit Buffer/Line Driver
    • 74VMEH22501: Texas 8-bit Bus Transceiver
    • FIN1108: Fairchild 8-port LVDS Repeater

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

digital components fpga
Digital Components: FPGA
  • SERDES integrated – SRAM technology
    • Xilinx SPARTAN6 (currently used)
      • Test of the first board prototype: SPS – 2014
    • Altera Stratix V
      • Cycling Redundancy Check of FPGA configuration
      • Possibility to get the corresponding ASIC
  • External SERDES  FPGA + GBT project
    • SRAM – if failures are mostly related to SERDES
    • Antifuse – MicrosemiAxceleratorAX2000
  • Flash RAM – for SRAM configuration
    • M25P128 – Numonyx

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

thank you for your attention
THANK YOU FOR YOUR ATTENTION!

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

spare slides psi radiation tests
Spare Slides: PSI Radiation Tests

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

psi sfp radiation setup
PSI: SFP Radiation Setup

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

sfp tests fttx ft3a05d
SFP Tests: FTTX FT3A05D

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

sfp tests lightron i3a
SFP Tests: Lightron I3A

BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

ad