TLP System For ESD Test Of Semiconductors

1. TLP System For ESD Test Of Semiconductors Start Sample loading I-V measurement Increase ESD Peak Pulse voltage ESD stress Transmission Line Pulse (TLP) stands for an ESD standard test in semiconductor industry. it is designed as a tool for analysis of ESD characteristics of electronic components, ESD protection devices and circuits. I-V measurement Maintaining or degradation Fail END • Model and Standard of ESD Test 4. TLP Test Results Zener diode+ GaN LED LC-type ESD/EMI filter • HBM/MM/IEC61000-4-2 test methods: ESD performance is evaluated by finding out a minimum strength of ESD pulse that causes substantial damages in a test sample. For example, the ESD robustness is defined when the leakage current of the test sample surpassed a predefined failure level. Therefore, those ESD simulators are used as a black box with a voltage-level stimulus and a simple “pass or fail” response. • From I-V characteristics of TLP technology, we can obtain many crucial ESD characteristics: e.g., leakage current, triggering voltage, holding voltage, dynamic resistance, thermal breakdown voltage and maximum peak pulse current. Those properties are essential to choose a best, correct, optimum ESD protection device. ESD Characterization Component Level Test System Level Test Bidirectional TVS diode Fast Recovery Diode Human Body Model Transmission Line Pulse Machine Model IEC 61000-4-2 Test Procedure for TLP Analysis Test Procedure for MM/HBM/IEC61000-4-2 European standard Developed from HBM System ESD test, Real time protection analysis RC-type ESD/EMI filter TLP I-V curve tracer Pulse generator TLP Pulse generator • ESD test using HBM and IEC61000-4-2 methods present how much the ESD robustness could be improved for the GaN LEDs assembled with TVS protection devices. • A TLP demo system will be available in June 2014 at SPRC(Semiconductor Physics Research Center), ChonBuk National University(CBNU). Anyone who are interested in experiencing the TLP system are welcome to participate this program. • The TLP demo system, provided by Barth’s Electronics, is very useful and essential to evaluate the performance of electrostatic discharge(ESD) protection capability for TVS (Transient Voltage Suppression) devices including Zener diode, ABD, ESD/EMI filter, ULC-TVS, TVS arrays, and other semiconductor devices as well. GaN LED IEC61000-4-2 HBM Normal GaN LED damage < ± 4 kV Normal GaN LED damage < ± 3 kV Location School of Semiconductor and Chemical Engineering, Semiconductor Physics Research Center, Chonbuk National University, Jeonju 561-756, Republic of Korea. GaN LED with TVS > ± 8 kV GaN LED with TVS > ± 30 kV 5. TLP at CBNU 3. ESD Test Example of GaN LEDs and FRDs 2. Comparison of ESD Test Methods Specifications: - 500 volts to an open DUT and 20 amps through a short. - Pulse rise time : 200ps, 2ns, and 10ns, - Pulse width: 75 ns, 100 ns Up to 10 strikes of ±3.5 kV Up to 10 strikes of ±5.5 kV Contact • Prof. Kyu-Hwan Shim, Email: khshim@jbnu.ac.kr, TEL: 063-270-4650, 4164 HP: 010-730-83556 • Mr. Daoheung BOUANGEUNE, Email: bouangeun@gmail.com, HP: 010-5590-2265 Barth Model 4002 TLP